Crossref proceedings-article
IEEE
2010 Symposium on VLSI Technology (263)
Bibliography

Cheng, C. H., Chin, A., & Yeh, F. S. (2010). Novel Ultra-low power RRAM with good endurance and retention. 2010 Symposium on VLSI Technology, 85–86.

Authors 3
  1. C. H. Cheng (first)
  2. Albert Chin (additional)
  3. F. S. Yeh (additional)
References 8 Referenced 59
  1. {'key': 'ref4', 'first-page': '101', 'author': 'seong', 'year': '2009', 'journal-title': 'IEDM Tech Dng'} / IEDM Tech Dng by seong (2009)
  2. {'key': 'ref3', 'first-page': '100', 'author': 'xu', 'year': '0', 'journal-title': 'Symp on VLSI Tech'} / Symp on VLSI Tech by xu (0)
  3. {'key': 'ref6', 'first-page': '26', 'author': 'yoon', 'year': '2009', 'journal-title': 'Symo on VLSITech'} / Symo on VLSITech by yoon (2009)
  4. {'key': 'ref5', 'first-page': '775', 'author': 'russo', 'year': '2007', 'journal-title': 'IEDM Tech Dng'} / IEDM Tech Dng by russo (2007)
  5. 10.1063/1.117795
  6. {'key': 'ref7', 'first-page': '843', 'author': 'lin', 'year': '2008', 'journal-title': 'IEDM Tech Dig'} / IEDM Tech Dig by lin (2008)
  7. {'key': 'ref2', 'first-page': '797', 'author': 'lee', 'year': '2006', 'journal-title': 'IEDM Tech Dig'} / IEDM Tech Dig by lee (2006)
  8. {'key': 'ref1', 'first-page': '777', 'author': 'sim', 'year': '2005', 'journal-title': 'IEDM Tech tng'} / IEDM Tech tng by sim (2005)
Dates
Type When
Created 14 years, 11 months ago (Aug. 24, 2010, 3:04 p.m.)
Deposited 8 years, 5 months ago (March 18, 2017, 3:52 p.m.)
Indexed 2 months ago (June 17, 2025, 6:21 p.m.)
Issued 15 years, 2 months ago (June 1, 2010)
Published 15 years, 2 months ago (June 1, 2010)
Published Print 15 years, 2 months ago (June 1, 2010)
Funders 0

None

@inproceedings{Cheng_2010, title={Novel Ultra-low power RRAM with good endurance and retention}, url={http://dx.doi.org/10.1109/vlsit.2010.5556180}, DOI={10.1109/vlsit.2010.5556180}, booktitle={2010 Symposium on VLSI Technology}, publisher={IEEE}, author={Cheng, C. H. and Chin, Albert and Yeh, F. S.}, year={2010}, month=jun, pages={85–86} }