Crossref
journal-article
Institute of Electrical and Electronics Engineers (IEEE)
IEEE Transactions on Instrumentation and Measurement (263)
References
2
Referenced
4
{'key': 'ref2', 'first-page': '94', 'article-title': 'Effect of surface recombination and channel on p-n junction and transistor characteristics', 'volume': 'ed 9', 'author': 'sah', 'year': '1962', 'journal-title': 'IEEE Trans Electron Devices'}
/ IEEE Trans Electron Devices / Effect of surface recombination and channel on p-n junction and transistor characteristics by sah (1962)10.1063/1.1720798
Dates
Type | When |
---|---|
Created | 17 years, 1 month ago (July 21, 2008, 1:30 p.m.) |
Deposited | 3 years, 8 months ago (Nov. 29, 2021, 10:46 a.m.) |
Indexed | 1 year, 6 months ago (Feb. 7, 2024, 4:46 p.m.) |
Issued | 52 years, 7 months ago (Jan. 1, 1973) |
Published | 52 years, 7 months ago (Jan. 1, 1973) |
Published Print | 52 years, 7 months ago (Jan. 1, 1973) |
@article{Kreider_1973, title={A Simple Stable Constant-Temperature Hot-Wire Anemometer}, volume={22}, ISSN={0018-9456}, url={http://dx.doi.org/10.1109/tim.1973.4314139}, DOI={10.1109/tim.1973.4314139}, number={2}, journal={IEEE Transactions on Instrumentation and Measurement}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Kreider, Jan F.}, year={1973}, pages={190–191} }