Four decades of research on thermal contact, gap, and joint resistance in microelectronics
10.1109/tcapt.2005.848483
Crossref journal-article
Institute of Electrical and Electronics Engineers (IEEE)
IEEE Transactions on Components and Packaging Technologies (263)
Bibliography

Yovanovich, M. M. (2005). Four decades of research on thermal contact, gap, and joint resistance in microelectronics. IEEE Transactions on Components and Packaging Technologies, 28(2), 182–206.

Authors 1
  1. M.M. Yovanovich (first)
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Dates
Type When
Created 20 years, 2 months ago (May 24, 2005, 10:38 a.m.)
Deposited 4 months, 1 week ago (April 11, 2025, 12:28 a.m.)
Indexed 13 hours, 22 minutes ago (Aug. 21, 2025, 2:02 p.m.)
Issued 20 years, 2 months ago (June 1, 2005)
Published 20 years, 2 months ago (June 1, 2005)
Published Print 20 years, 2 months ago (June 1, 2005)
Funders 0

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@article{Yovanovich_2005, title={Four decades of research on thermal contact, gap, and joint resistance in microelectronics}, volume={28}, ISSN={1521-3331}, url={http://dx.doi.org/10.1109/tcapt.2005.848483}, DOI={10.1109/tcapt.2005.848483}, number={2}, journal={IEEE Transactions on Components and Packaging Technologies}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Yovanovich, M.M.}, year={2005}, month=jun, pages={182–206} }