DOI: 10.1109/tcapt.2004.843189. Minimizing the uncertainties associated with the measurement of thermal properties by the Transient thermo-reflectance method

Minimizing the uncertainties associated with the measurement of thermal properties by the Transient thermo-reflectance method

10.1109/tcapt.2004.843189

Crossref journal-article

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Transactions on Components and Packaging Technologies (263)

Bibliography

Burzo, M. G., Komarov, P. L., & Raad, P. E. (2005). Minimizing the uncertainties associated with the measurement of thermal properties by the Transient thermo-reflectance method. IEEE Transactions on Components and Packaging Technologies, 28(1), 39â44.

Authors 3

M.G. Burzo (first)
P.L. Komarov (additional)
P.E. Raad (additional)

References 19 Referenced 16

{'key': 'ref10', 'author': 'burzo', 'year': '2001', 'journal-title': 'Transient thermoreflectance measurements of the thermal properties of metallized thin film electronics materials'} / Transient thermoreflectance measurements of the thermal properties of metallized thin film electronics materials by burzo (2001)
10.1016/j.ijheatmasstransfer.2004.02.006
10.1115/1.1517265
10.1063/1.1661506
10.1109/JQE.1981.1071264
10.1016/S0026-2692(02)00052-6
10.1103/PhysRevB.5.3883
10.1103/PhysRevLett.19.16
10.1103/PhysRevLett.18.445
{'key': 'ref19', 'first-page': '279', 'article-title': "Effet de la Temperature sur la Reflectivite du Silicium Oxyde: Determination Experimentale de la Sensibilite Relative; Application a la Mesure sans Contact de la Temperature a la Surface d'un Thyristor GTO en Commutation", 'volume': '6', 'author': 'abid', 'year': '1996', 'journal-title': 'J Phys Ill'} / J Phys Ill / Effet de la Temperature sur la Reflectivite du Silicium Oxyde: Determination Experimentale de la Sensibilite Relative; Application a la Mesure sans Contact de la Temperature a la Surface d'un Thyristor GTO en Commutation by abid (1996)
10.1063/1.337642
{'key': 'ref3', 'author': 'tzou', 'year': '1997', 'journal-title': 'Macro- to Microscale Heat Transfer (The Lagging Behavior)'} / Macro- to Microscale Heat Transfer (The Lagging Behavior) by tzou (1997)
10.1007/BF01133562
10.1115/1.2822301
10.1063/1.1147100
10.1115/1.2911404
10.1063/1.112933
10.1109/TCAPT.2003.811467
10.1143/JJAP.38.L1268

Dates

Type	When
Created	20 years, 5 months ago (March 7, 2005, 8:32 a.m.)
Deposited	3 years, 9 months ago (Nov. 29, 2021, 10:40 a.m.)
Indexed	5 months ago (March 28, 2025, 7 a.m.)
Issued	20 years, 5 months ago (March 1, 2005)
Published	20 years, 5 months ago (March 1, 2005)
Published Print	20 years, 5 months ago (March 1, 2005)

Funders 0

None

BibTeX

@article{Burzo_2005, title={Minimizing the uncertainties associated with the measurement of thermal properties by the Transient thermo-reflectance method}, volume={28}, ISSN={1521-3331}, url={http://dx.doi.org/10.1109/tcapt.2004.843189}, DOI={10.1109/tcapt.2004.843189}, number={1}, journal={IEEE Transactions on Components and Packaging Technologies}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Burzo, M.G. and Komarov, P.L. and Raad, P.E.}, year={2005}, month=mar, pages={39–44} }

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