DOI: 10.1109/soi.1992.664822. A New Method for Characterizing Dynamic Self-Heating in Soi Mosfets

A New Method for Characterizing Dynamic Self-Heating in Soi Mosfets

10.1109/soi.1992.664822

Crossref proceedings-article

IEEE

IEEE International SOI Conference (263)

Bibliography

Caviglia, A., & Iliadis, A. A. (n.d.). A New Method for Characterizing Dynamic Self-Heating in Soi Mosfets. IEEE International SOI Conference, 118â119.

Authors 2

A. Caviglia (first)
A.A. Iliadis (additional)

References 4 Referenced 7

10.1049/el:19900048
{'key': 'ref3', 'first-page': '24', 'article-title': 'THERMAL TIME CONSTANTS IN SOI-MOSFETS', 'author': 'burger', 'year': '0', 'journal-title': 'Proceedings 1991 IEEE International SOI Conference'} / Proceedings 1991 IEEE International SOI Conference / THERMAL TIME CONSTANTS IN SOI-MOSFETS by burger (0)
10.1109/55.145053
10.1049/el:19890557

Dates

Type	When
Created	20 years ago (Aug. 24, 2005, 4:50 p.m.)
Deposited	8 years, 5 months ago (March 8, 2017, 10:22 p.m.)
Indexed	11 months, 2 weeks ago (Sept. 5, 2024, 3:31 a.m.)

Funders 0

None

BibTeX

@inproceedings{Caviglia, title={A New Method for Characterizing Dynamic Self-Heating in Soi Mosfets}, url={http://dx.doi.org/10.1109/soi.1992.664822}, DOI={10.1109/soi.1992.664822}, booktitle={IEEE International SOI Conference}, publisher={IEEE}, author={Caviglia, A. and Iliadis, A.A.}, pages={118–119} }

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