Crossref journal-article
Institute of Electrical and Electronics Engineers (IEEE)
Proceedings of the IRE (263)
Bibliography

Sah, C., Noyce, R., & Shockley, W. (1957). Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics. Proceedings of the IRE, 45(9), 1228–1243.

Authors 3
  1. Chih-tang Sah (first)
  2. Robert Noyce (additional)
  3. William Shockley (additional)
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Dates
Type When
Created 17 years, 1 month ago (July 18, 2008, 2:37 p.m.)
Deposited 3 years, 8 months ago (Nov. 29, 2021, 3:25 p.m.)
Indexed 2 weeks ago (Aug. 7, 2025, 4:44 p.m.)
Issued 67 years, 11 months ago (Sept. 1, 1957)
Published 67 years, 11 months ago (Sept. 1, 1957)
Published Print 67 years, 11 months ago (Sept. 1, 1957)
Funders 0

None

@article{Sah_1957, title={Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics}, volume={45}, ISSN={0096-8390}, url={http://dx.doi.org/10.1109/jrproc.1957.278528}, DOI={10.1109/jrproc.1957.278528}, number={9}, journal={Proceedings of the IRE}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sah, Chih-tang and Noyce, Robert and Shockley, William}, year={1957}, month=sep, pages={1228–1243} }