DOI: 10.1109/jrproc.1955.277857. Measurement of Minority Carrier Lifetime and Surface Effects in Junction Devices

Measurement of Minority Carrier Lifetime and Surface Effects in Junction Devices

10.1109/jrproc.1955.277857

Crossref journal-article

Institute of Electrical and Electronics Engineers (IEEE)

Proceedings of the IRE (263)

Bibliography

Lederhandler, S., & Giacoletto, L. (1955). Measurement of Minority Carrier Lifetime and Surface Effects in Junction Devices. Proceedings of the IRE, 43(4), 477â483.

Authors 2

S. Lederhandler (first)
L. Giacoletto (additional)

References 16 Referenced 126

10.1002/j.1538-7305.1949.tb03645.x
{'key': 'ref10', 'first-page': '506', 'article-title': 'Study of p-n-p alloy junction transistor from dc through medium frequencies', 'volume': '15', 'author': 'giacoletto', 'year': '1954', 'journal-title': 'RCA Rev'} / RCA Rev / Study of p-n-p alloy junction transistor from dc through medium frequencies by giacoletto (1954)
{'key': 'ref5b', 'first-page': '1416', 'article-title': 'Measurement of lifetimes and diffusion constants in germanium', 'volume': '94', 'author': 'stevenson', 'year': '1954', 'journal-title': 'Phys Rev'} / Phys Rev / Measurement of lifetimes and diffusion constants in germanium by stevenson (1954)
10.1103/PhysRev.90.278
10.1063/1.1721146
10.1109/JRPROC.1954.274521
10.1063/1.1721830
{'key': 'ref9b', 'first-page': '318', 'author': 'shockley', 'year': '1950', 'journal-title': 'Electrons and Holes in Semiconductors'} / Electrons and Holes in Semiconductors by shockley (1950)
{'key': 'ref4', 'first-page': '312', 'author': 'shockley', 'year': '1950', 'journal-title': 'Electrons and Holes in Semiconductors'} / Electrons and Holes in Semiconductors by shockley (1950)
10.1103/PhysRev.91.1012
10.1109/JRPROC.1952.273961
10.1109/JRPROC.1954.274750
{'key': 'ref7', 'first-page': '318', 'author': 'shockley', 'year': '1950', 'journal-title': 'Electrons and Holes in Semiconductors'} / Electrons and Holes in Semiconductors by shockley (1950)
10.1109/JRPROC.1952.273959
10.1109/JRPROC.1952.273973
{'key': 'ref5a', 'year': '0'} (0)

Dates

Type	When
Created	17 years, 1 month ago (July 18, 2008, 2:37 p.m.)
Deposited	3 years, 8 months ago (Nov. 29, 2021, 3:24 p.m.)
Indexed	2 months ago (June 25, 2025, 8:10 p.m.)
Issued	70 years, 7 months ago (Jan. 1, 1955)
Published	70 years, 7 months ago (Jan. 1, 1955)
Published Print	70 years, 7 months ago (Jan. 1, 1955)

Funders 0

None

BibTeX

@article{Lederhandler_1955, title={Measurement of Minority Carrier Lifetime and Surface Effects in Junction Devices}, volume={43}, ISSN={0096-8390}, url={http://dx.doi.org/10.1109/jrproc.1955.277857}, DOI={10.1109/jrproc.1955.277857}, number={4}, journal={Proceedings of the IRE}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Lederhandler, S. and Giacoletto, L.}, year={1955}, pages={477–483} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        6,
        26
      ]
    ],
    "date-time": "2025-06-26T00:10:55Z",
    "timestamp": 1750896655191
  },
  "reference-count": 16,
  "publisher": "Institute of Electrical and Electronics Engineers (IEEE)",
  "issue": "4",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1955,
            1,
            1
          ]
        ],
        "date-time": "1955-01-01T00:00:00Z",
        "timestamp": -473385600000
      },
      "content-version": "vor",
      "delay-in-days": 0,
      "URL": "https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1955
      ]
    ]
  },
  "DOI": "10.1109/jrproc.1955.277857",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2008,
        7,
        18
      ]
    ],
    "date-time": "2008-07-18T18:37:59Z",
    "timestamp": 1216406279000
  },
  "page": "477-483",
  "source": "Crossref",
  "is-referenced-by-count": 126,
  "title": "Measurement of Minority Carrier Lifetime and Surface Effects in Junction Devices",
  "prefix": "10.1109",
  "volume": "43",
  "author": [
    {
      "given": "S.",
      "family": "Lederhandler",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "L.",
      "family": "Giacoletto",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "263",
  "reference": [
    {
      "key": "ref9a",
      "doi-asserted-by": "publisher",
      "DOI": "10.1002/j.1538-7305.1949.tb03645.x"
    },
    {
      "key": "ref10",
      "first-page": "506",
      "article-title": "Study of p-n-p alloy junction transistor from dc through medium frequencies",
      "volume": "15",
      "author": "giacoletto",
      "year": "1954",
      "journal-title": "RCA Rev"
    },
    {
      "key": "ref5b",
      "first-page": "1416",
      "article-title": "Measurement of lifetimes and diffusion constants in germanium",
      "volume": "94",
      "author": "stevenson",
      "year": "1954",
      "journal-title": "Phys Rev"
    },
    {
      "key": "ref11",
      "doi-asserted-by": "publisher",
      "DOI": "10.1103/PhysRev.90.278"
    },
    {
      "key": "ref12",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.1721146"
    },
    {
      "key": "ref13",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/JRPROC.1954.274521"
    },
    {
      "key": "ref14",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.1721830"
    },
    {
      "key": "ref9b",
      "first-page": "318",
      "author": "shockley",
      "year": "1950",
      "journal-title": "Electrons and Holes in Semiconductors"
    },
    {
      "key": "ref4",
      "first-page": "312",
      "author": "shockley",
      "year": "1950",
      "journal-title": "Electrons and Holes in Semiconductors"
    },
    {
      "key": "ref3",
      "doi-asserted-by": "publisher",
      "DOI": "10.1103/PhysRev.91.1012"
    },
    {
      "key": "ref6",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/JRPROC.1952.273961"
    },
    {
      "key": "ref8",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/JRPROC.1954.274750"
    },
    {
      "key": "ref7",
      "first-page": "318",
      "author": "shockley",
      "year": "1950",
      "journal-title": "Electrons and Holes in Semiconductors"
    },
    {
      "key": "ref2",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/JRPROC.1952.273959"
    },
    {
      "key": "ref1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/JRPROC.1952.273973"
    },
    {
      "key": "ref5a",
      "year": "0"
    }
  ],
  "container-title": "Proceedings of the IRE",
  "original-title": [],
  "link": [
    {
      "URL": "http://xplorestaging.ieee.org/ielx5/10933/4055422/04055436.pdf?arnumber=4055436",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2021,
        11,
        29
      ]
    ],
    "date-time": "2021-11-29T20:24:50Z",
    "timestamp": 1638217490000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "http://ieeexplore.ieee.org/document/4055436/"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1955
      ]
    ]
  },
  "references-count": 16,
  "journal-issue": {
    "issue": "4"
  },
  "URL": "http://dx.doi.org/10.1109/JRPROC.1955.277857",
  "relation": {},
  "ISSN": [
    "0096-8390"
  ],
  "subject": [],
  "container-title-short": "Proc. IRE",
  "published": {
    "date-parts": [
      [
        1955
      ]
    ]
  }
}