10.1109/jproc.2012.2190369
Crossref journal-article
Institute of Electrical and Electronics Engineers (IEEE)
Proceedings of the IEEE (263)
Bibliography

Wong, H.-S. P., Lee, H.-Y., Yu, S., Chen, Y.-S., Wu, Y., Chen, P.-S., Lee, B., Chen, F. T., & Tsai, M.-J. (2012). Metal–Oxide RRAM. Proceedings of the IEEE, 100(6), 1951–1970.

Authors 9
  1. H.-S. Philip Wong (first)
  2. Heng-Yuan Lee (additional)
  3. Shimeng Yu (additional)
  4. Yu-Sheng Chen (additional)
  5. Yi Wu (additional)
  6. Pang-Shiu Chen (additional)
  7. Byoungil Lee (additional)
  8. Frederick T. Chen (additional)
  9. Ming-Jinn Tsai (additional)
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Dates
Type When
Created 13 years, 2 months ago (May 25, 2012, 12:50 p.m.)
Deposited 1 year, 4 months ago (April 24, 2024, 4:23 p.m.)
Indexed 20 hours, 18 minutes ago (Aug. 23, 2025, 9:55 p.m.)
Issued 13 years, 2 months ago (June 1, 2012)
Published 13 years, 2 months ago (June 1, 2012)
Published Print 13 years, 2 months ago (June 1, 2012)
Funders 0

None

@article{Wong_2012, title={Metal–Oxide RRAM}, volume={100}, ISSN={1558-2256}, url={http://dx.doi.org/10.1109/jproc.2012.2190369}, DOI={10.1109/jproc.2012.2190369}, number={6}, journal={Proceedings of the IEEE}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Wong, H.-S. Philip and Lee, Heng-Yuan and Yu, Shimeng and Chen, Yu-Sheng and Wu, Yi and Chen, Pang-Shiu and Lee, Byoungil and Chen, Frederick T. and Tsai, Ming-Jinn}, year={2012}, month=jun, pages={1951–1970} }