DOI: 10.1109/jproc.2006.879794. Heat Generation and Transport in Nanometer-Scale Transistors

Heat Generation and Transport in Nanometer-Scale Transistors

10.1109/jproc.2006.879794

Crossref journal-article

Institute of Electrical and Electronics Engineers (IEEE)

Proceedings of the IEEE (263)

Bibliography

Pop, E., Sinha, S., & Goodson, K. E. (2006). Heat Generation and Transport in Nanometer-Scale Transistors. Proceedings of the IEEE, 94(8), 1587â1601.

Authors 3

E. Pop (first)
S. Sinha (additional)
K.E. Goodson (additional)

References 67 Referenced 554

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{'key': 'ref33', 'author': 'sinha', 'year': '2005', 'journal-title': 'Non-equilibrium phonons in silicon field-effect transistors'} / Non-equilibrium phonons in silicon field-effect transistors by sinha (2005)
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{'key': 'ref26', 'first-page': '161', 'article-title': 'impact of self-heating on digital soi and strained-silicon cmos circuits', 'author': 'jenkins', 'year': '2003', 'journal-title': 'Proc IEEE Int SOI Conf'} / Proc IEEE Int SOI Conf / impact of self-heating on digital soi and strained-silicon cmos circuits by jenkins (2003)
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{'key': 'ref4', 'first-page': '62', 'article-title': 'emerging directions for packaging technologies', 'volume': '6', 'author': 'mahajan', 'year': '2002', 'journal-title': 'Intel Technol J'} / Intel Technol J / emerging directions for packaging technologies by mahajan (2002)
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10.1017/CBO9780511618611
{'key': 'ref5', 'first-page': '411', 'article-title': 'electro-thermal comparison and performance optimization of thin-body soi and goi mosfets', 'author': 'pop', 'year': '2004', 'journal-title': 'Proc IEEE Int Electron Devices Mtg (IEDM)'} / Proc IEEE Int Electron Devices Mtg (IEDM) / electro-thermal comparison and performance optimization of thin-body soi and goi mosfets by pop (2004)
10.1063/1.1870106
10.1063/1.123994
{'key': 'ref49', 'first-page': '18.3.1', 'article-title': 'a germanium nmosfet process integrating metal gate and improved high-k dielectric', 'author': 'chui', 'year': '2003', 'journal-title': 'Tech Dig IEEE Int Electron Devices Meeting (IEDM)'} / Tech Dig IEEE Int Electron Devices Meeting (IEDM) / a germanium nmosfet process integrating metal gate and improved high-k dielectric by chui (2003)
10.1109/SISPAD.2005.201534 / 2005 International Conference On Simulation of Semiconductor Processes and Devices / joule heating under quasi-ballistic transport conditions in bulk and strained silicon devices by pop (2005)
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{'key': 'ref45', 'first-page': '31.1.1', 'article-title': 'localized heating effects and scaling of sub-0.18 micron cmos devices', 'author': 'pop', 'year': '2001', 'journal-title': 'Tech Dig IEEE Int Electron Devices Meeting (IEDM)'} / Tech Dig IEEE Int Electron Devices Meeting (IEDM) / localized heating effects and scaling of sub-0.18 micron cmos devices by pop (2001)
10.1109/ESSDER.2005.1546589
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10.1063/1.1758301
10.1063/1.1524305
10.1109/IEDM.2005.1609527
10.1063/1.1481958

Dates

Type	When
Created	18 years, 10 months ago (Sept. 29, 2006, 3:04 p.m.)
Deposited	3 years, 8 months ago (Nov. 29, 2021, 3:22 p.m.)
Indexed	2 weeks, 1 day ago (Aug. 6, 2025, 9:12 a.m.)
Issued	19 years ago (Aug. 1, 2006)
Published	19 years ago (Aug. 1, 2006)
Published Print	19 years ago (Aug. 1, 2006)

Funders 0

None

BibTeX

@article{Pop_2006, title={Heat Generation and Transport in Nanometer-Scale Transistors}, volume={94}, ISSN={1558-2256}, url={http://dx.doi.org/10.1109/jproc.2006.879794}, DOI={10.1109/jproc.2006.879794}, number={8}, journal={Proceedings of the IEEE}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Pop, E. and Sinha, S. and Goodson, K.E.}, year={2006}, month=aug, pages={1587–1601} }

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