Crossref proceedings-article
IEEE
2009 IEEE International Electron Devices Meeting (IEDM) (263)
Bibliography

Bez, R. (2009). Chalcogenide PCM: a memory technology for next decade. 2009 IEEE International Electron Devices Meeting (IEDM).

Authors 1
  1. Roberto Bez (first)
References 24 Referenced 73
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  22. {'key': 'ref21', 'article-title': 'Cross-point pcm with 4F2 cell size driven by low-contact-resistivity poly-Si diode', 'author': 'sasago', 'year': '2008', 'journal-title': 'VLSI Tech Symp T'} / VLSI Tech Symp T / Cross-point pcm with 4F2 cell size driven by low-contact-resistivity poly-Si diode by sasago (2008)
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  24. 10.1103/PhysRevLett.21.1450
Dates
Type When
Created 15 years, 4 months ago (March 30, 2010, 3:44 p.m.)
Deposited 8 years, 5 months ago (March 19, 2017, 12:25 a.m.)
Indexed 2 months, 2 weeks ago (June 3, 2025, 3:27 a.m.)
Issued 15 years, 8 months ago (Dec. 1, 2009)
Published 15 years, 8 months ago (Dec. 1, 2009)
Published Print 15 years, 8 months ago (Dec. 1, 2009)
Funders 0

None

@inproceedings{Bez_2009, title={Chalcogenide PCM: a memory technology for next decade}, url={http://dx.doi.org/10.1109/iedm.2009.5424415}, DOI={10.1109/iedm.2009.5424415}, booktitle={2009 IEEE International Electron Devices Meeting (IEDM)}, publisher={IEEE}, author={Bez, Roberto}, year={2009}, month=dec }