Crossref
proceedings-article
IEEE
International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (263)
References
4
Referenced
149
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/ SPIE / Nonvolatile, high density, high performance phase change memory by wicker (1999)10.1063/1.348620
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/ Electronics / Nonvolatile and reprogrammable, the read-mostly memory is here by neale (1970)
@inproceedings{Lai, series={IEDM-01}, title={OUM - A 180 nm nonvolatile memory cell element technology for stand alone and embedded applications}, url={http://dx.doi.org/10.1109/iedm.2001.979636}, DOI={10.1109/iedm.2001.979636}, booktitle={International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224)}, publisher={IEEE}, author={Lai, S. and Lowrey, T.}, pages={36.5.1-36.5.4}, collection={IEDM-01} }