DOI: 10.1109/iedm.1993.347215. Three-dimensional "atomistic" simulation of discrete random dopant distribution effects in sub-0.1 μm MOSFET's

Three-dimensional "atomistic" simulation of discrete random dopant distribution effects in sub-0.1 μm MOSFET's

10.1109/iedm.1993.347215

Crossref proceedings-article

IEEE

Proceedings of IEEE International Electron Devices Meeting (263)

Bibliography

Hon-Sum Wong, & Yuan Taur. (n.d.). Three-dimensional âatomisticâ simulation of discrete random dopant distribution effects in sub-0.1 Î¼m MOSFETâs. Proceedings of IEEE International Electron Devices Meeting, 705â708.

Authors 2

Hon-Sum Wong (first)
Yuan Taur (additional)

References 7 Referenced 48

{'key': 'ref4', 'first-page': '245', 'author': 'keyes', 'year': '1975', 'journal-title': 'IEEE JSSC'} / IEEE JSSC by keyes (1975)
10.1016/0038-1101(72)90103-7
{'key': 'ref6', 'first-page': '46', 'author': 'hagiwara', 'year': '1982', 'journal-title': 'VLSI Symp'} / VLSI Symp by hagiwara (1982)
10.1116/1.571121
{'key': 'ref7', 'first-page': '291', 'author': 'buturla', 'year': '1989', 'journal-title': 'NASCODE VI'} / NASCODE VI by buturla (1989)
10.1109/16.123489
10.1109/VLSIT.1993.760235

Dates

Type	When
Created	22 years, 7 months ago (Dec. 30, 2002, 4:26 p.m.)
Deposited	8 years, 5 months ago (March 8, 2017, 11:55 p.m.)
Indexed	1 month, 3 weeks ago (June 28, 2025, 10:41 a.m.)

Funders 0

None

BibTeX

@inproceedings{Hon_Sum_Wong, series={IEDM-93}, title={Three-dimensional “atomistic” simulation of discrete random dopant distribution effects in sub-0.1 μm MOSFET’s}, url={http://dx.doi.org/10.1109/iedm.1993.347215}, DOI={10.1109/iedm.1993.347215}, booktitle={Proceedings of IEEE International Electron Devices Meeting}, publisher={IEEE}, author={Hon-Sum Wong and Yuan Taur}, pages={705–708}, collection={IEDM-93} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        6,
        28
      ]
    ],
    "date-time": "2025-06-28T14:41:51Z",
    "timestamp": 1751121711395
  },
  "reference-count": 7,
  "publisher": "IEEE",
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "DOI": "10.1109/iedm.1993.347215",
  "type": "proceedings-article",
  "created": {
    "date-parts": [
      [
        2002,
        12,
        30
      ]
    ],
    "date-time": "2002-12-30T21:26:32Z",
    "timestamp": 1041283592000
  },
  "page": "705-708",
  "source": "Crossref",
  "is-referenced-by-count": 48,
  "title": "Three-dimensional \"atomistic\" simulation of discrete random dopant distribution effects in sub-0.1 \u03bcm MOSFET's",
  "prefix": "10.1109",
  "author": [
    {
      "family": "Hon-Sum Wong",
      "sequence": "first",
      "affiliation": []
    },
    {
      "family": "Yuan Taur",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "263",
  "reference": [
    {
      "key": "ref4",
      "first-page": "245",
      "author": "keyes",
      "year": "1975",
      "journal-title": "IEEE JSSC"
    },
    {
      "key": "ref3",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0038-1101(72)90103-7"
    },
    {
      "key": "ref6",
      "first-page": "46",
      "author": "hagiwara",
      "year": "1982",
      "journal-title": "VLSI Symp"
    },
    {
      "key": "ref5",
      "doi-asserted-by": "publisher",
      "DOI": "10.1116/1.571121"
    },
    {
      "key": "ref7",
      "first-page": "291",
      "author": "buturla",
      "year": "1989",
      "journal-title": "NASCODE VI"
    },
    {
      "key": "ref2",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/16.123489"
    },
    {
      "key": "ref1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/VLSIT.1993.760235"
    }
  ],
  "event": "IEEE International Electron Devices Meeting",
  "container-title": "Proceedings of IEEE International Electron Devices Meeting",
  "original-title": [],
  "link": [
    {
      "URL": "http://xplorestaging.ieee.org/ielx2/1088/8045/00347215.pdf?arnumber=347215",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2017,
        3,
        9
      ]
    ],
    "date-time": "2017-03-09T04:55:01Z",
    "timestamp": 1489035301000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "http://ieeexplore.ieee.org/document/347215/"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        null
      ]
    ]
  },
  "references-count": 7,
  "URL": "http://dx.doi.org/10.1109/IEDM.1993.347215",
  "relation": {},
  "subject": []
}