Crossref proceedings-article
IEEE
Proceedings of IEEE International Electron Devices Meeting (263)
Bibliography

Su, L. T., Sherony, M. J., Hang Hu, Chung, J. E., & Antoniadis, D. A. (n.d.). Optimization of series resistance in sub-0.2 μm SOI MOSFETs. Proceedings of IEEE International Electron Devices Meeting, 723–726.

Authors 5
  1. L.T. Su (first)
  2. M.J. Sherony (additional)
  3. Hang Hu (additional)
  4. J.E. Chung (additional)
  5. D.A. Antoniadis (additional)
References 9 Referenced 15
  1. 10.1109/16.129100
  2. 10.1109/55.145038
  3. 10.1109/T-ED.1987.22956 / IEEE Transactions on Electron Devices / the impact of intrinsic series resistance on mosfet scaling by ng (1987)
  4. {'journal-title': 'MEDICI users manual', 'year': '1992', 'key': 'ref5'} / MEDICI users manual (1992)
  5. 10.1109/16.163462
  6. {'key': 'ref7', 'first-page': '829', 'author': 'hisamoto', 'year': '1992', 'journal-title': 'IEDM Technical Digest'} / IEDM Technical Digest by hisamoto (1992)
  7. {'key': 'ref2', 'first-page': '906', 'author': 'miki', 'year': '1989', 'journal-title': 'IEDM Technical Digest'} / IEDM Technical Digest by miki (1989)
  8. 10.1063/1.349713
  9. {'key': 'ref1', 'first-page': '675', 'author': 'omura', 'year': '1991', 'journal-title': 'IEDM Technical Digest'} / IEDM Technical Digest by omura (1991)
Dates
Type When
Created 22 years, 7 months ago (Dec. 30, 2002, 4:26 p.m.)
Deposited 8 years, 2 months ago (June 15, 2017, 1:06 p.m.)
Indexed 4 months, 3 weeks ago (April 1, 2025, 12:44 a.m.)
Funders 0

None

@inproceedings{Su, series={IEDM-93}, title={Optimization of series resistance in sub-0.2 μm SOI MOSFETs}, url={http://dx.doi.org/10.1109/iedm.1993.347211}, DOI={10.1109/iedm.1993.347211}, booktitle={Proceedings of IEEE International Electron Devices Meeting}, publisher={IEEE}, author={Su, L.T. and Sherony, M.J. and Hang Hu and Chung, J.E. and Antoniadis, D.A.}, pages={723–726}, collection={IEDM-93} }