DOI: 10.1109/55.568762. Experimental determination of electron and hole mobilities in MOS accumulation layers

Experimental determination of electron and hole mobilities in MOS accumulation layers

10.1109/55.568762

Crossref journal-article

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Electron Device Letters (263)

Authors 7

J.B. McKeon (first)
G. Chindalore (additional)
S.A. Hareland (additional)
W.-K. Shih (additional)
C. Wang (additional)
A.F. Tasch (additional)
C.M. Maziar (additional)

References 12 Referenced 16

10.1109/IEDM.1993.347317
10.1109/VLSIT.1993.760264
10.1109/IEDM.1988.32840
{'key': 'ref6', 'first-page': '18', 'article-title': 'characterization of the electron mobility in the inverted <formula><tex>$\\langle$</tex></formula>100<formula><tex>$\\rangle$</tex></formula> silicon surface', 'author': 'sabnis', 'year': '1979', 'journal-title': 'IEEE IEDM Tech Dig'} / IEEE IEDM Tech Dig / characterization of the electron mobility in the inverted <formula><tex>$\langle$</tex></formula>100<formula><tex>$\rangle$</tex></formula> silicon surface by sabnis (1979)
10.1149/1.2404044
10.1109/16.372076
10.1109/T-ED.1983.21207
{'key': 'ref8', 'author': 'ho', 'year': '1984', 'journal-title': 'SUPREM III&#x2014 A program for integrated circuit process modeling and simulation'} / SUPREM III&#x2014 A program for integrated circuit process modeling and simulation by ho (1984)
{'key': 'ref7', 'author': 'pinto', 'year': '1986', 'journal-title': 'PISCES-IIB&#x2014 poisson and continuity equation solver'} / PISCES-IIB&#x2014 poisson and continuity equation solver by pinto (1986)
10.1063/1.342800
10.1109/T-ED.1980.20063
{'key': 'ref9', 'first-page': '323', 'author': 'ashcroft', 'year': '1976', 'journal-title': 'Solid State Physics'} / Solid State Physics by ashcroft (1976)

Dates

Type	When
Created	22 years, 11 months ago (Aug. 24, 2002, 2:46 p.m.)
Deposited	3 years, 8 months ago (Nov. 29, 2021, 3:09 p.m.)
Indexed	5 months ago (March 19, 2025, 7:58 a.m.)
Issued	28 years, 3 months ago (May 1, 1997)
Published	28 years, 3 months ago (May 1, 1997)
Published Print	28 years, 3 months ago (May 1, 1997)

Funders 0

None

BibTeX

@article{McKeon_1997, title={Experimental determination of electron and hole mobilities in MOS accumulation layers}, volume={18}, ISSN={1558-0563}, url={http://dx.doi.org/10.1109/55.568762}, DOI={10.1109/55.568762}, number={5}, journal={IEEE Electron Device Letters}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={McKeon, J.B. and Chindalore, G. and Hareland, S.A. and Shih, W.-K. and Wang, C. and Tasch, A.F. and Maziar, C.M.}, year={1997}, month=may, pages={200–202} }

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