DOI: 10.1109/55.372496. Measurement of I-V curves of silicon-on-insulator (SOI) MOSFET's without self-heating

Measurement of I-V curves of silicon-on-insulator (SOI) MOSFET's without self-heating

10.1109/55.372496

Crossref journal-article

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Electron Device Letters (263)

Bibliography

Jenkins, K. A., & Sun, J. Y.-C. (1995). Measurement of I-V curves of silicon-on-insulator (SOI) MOSFETâs without self-heating. IEEE Electron Device Letters, 16(4), 145â147.

Authors 2

K.A. Jenkins (first)
J.Y.-C. Sun (additional)

References 6 Referenced 63

Dates

Type	When
Created	22 years, 11 months ago (Aug. 24, 2002, 2:46 p.m.)
Deposited	3 years, 8 months ago (Nov. 29, 2021, 3:09 p.m.)
Indexed	3 months ago (May 18, 2025, 1:21 a.m.)
Issued	30 years, 4 months ago (April 1, 1995)
Published	30 years, 4 months ago (April 1, 1995)
Published Print	30 years, 4 months ago (April 1, 1995)

Funders 0

None

BibTeX

@article{Jenkins_1995, title={Measurement of I-V curves of silicon-on-insulator (SOI) MOSFET’s without self-heating}, volume={16}, ISSN={1558-0563}, url={http://dx.doi.org/10.1109/55.372496}, DOI={10.1109/55.372496}, number={4}, journal={IEEE Electron Device Letters}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Jenkins, K.A. and Sun, J.Y.-C.}, year={1995}, month=apr, pages={145–147} }

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