Crossref
journal-article
Institute of Electrical and Electronics Engineers (IEEE)
IEEE Transactions on Pattern Analysis and Machine Intelligence (263)
References
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Dates
Type | When |
---|---|
Created | 22 years, 11 months ago (Aug. 24, 2002, 7:09 p.m.) |
Deposited | 3 years, 8 months ago (Nov. 29, 2021, 3:06 p.m.) |
Indexed | 2 weeks, 2 days ago (Aug. 6, 2025, 9:30 a.m.) |
Issued | 31 years, 7 months ago (Jan. 1, 1994) |
Published | 31 years, 7 months ago (Jan. 1, 1994) |
Published Print | 31 years, 7 months ago (Jan. 1, 1994) |
@article{Storvik_1994, title={A Bayesian approach to dynamic contours through stochastic sampling and simulated annealing}, volume={16}, ISSN={0162-8828}, url={http://dx.doi.org/10.1109/34.329011}, DOI={10.1109/34.329011}, number={10}, journal={IEEE Transactions on Pattern Analysis and Machine Intelligence}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Storvik, G.}, year={1994}, pages={976–986} }