Crossref journal-article
Institute of Electrical and Electronics Engineers (IEEE)
IEEE Transactions on Pattern Analysis and Machine Intelligence (263)
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Comaniciu, D., & Meer, P. (2002). Mean shift: a robust approach toward feature space analysis. IEEE Transactions on Pattern Analysis and Machine Intelligence, 24(5), 603–619.

Authors 2
  1. D. Comaniciu (first)
  2. P. Meer (additional)
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Dates
Type When
Created 22 years, 11 months ago (Aug. 24, 2002, 4:14 p.m.)
Deposited 5 months ago (March 15, 2025, 1:35 a.m.)
Indexed 1 hour ago (Aug. 21, 2025, 6:50 a.m.)
Issued 23 years, 3 months ago (May 1, 2002)
Published 23 years, 3 months ago (May 1, 2002)
Published Print 23 years, 3 months ago (May 1, 2002)
Funders 0

None

@article{Comaniciu_2002, title={Mean shift: a robust approach toward feature space analysis}, volume={24}, ISSN={0162-8828}, url={http://dx.doi.org/10.1109/34.1000236}, DOI={10.1109/34.1000236}, number={5}, journal={IEEE Transactions on Pattern Analysis and Machine Intelligence}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Comaniciu, D. and Meer, P.}, year={2002}, month=may, pages={603–619} }