DOI: 10.1109/23.775523. Performance of CdZnTe geometrically weighted semiconductor Frisch grid radiation detectors

Performance of CdZnTe geometrically weighted semiconductor Frisch grid radiation detectors

10.1109/23.775523

Crossref journal-article

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Transactions on Nuclear Science (263)

Bibliography

McGregor, D. S., & Rojeski, R. A. (1999). Performance of CdZnTe geometrically weighted semiconductor Frisch grid radiation detectors. IEEE Transactions on Nuclear Science, 46(3), 250â259.

Authors 2

D.S. McGregor (first)
R.A. Rojeski (additional)

References 35 Referenced 25

10.1146/annurev.ns.38.120188.001245
10.1016/0029-554X(71)90235-7
10.1103/PhysRevLett.75.156
10.1016/0029-554X(69)90561-8
10.1109/23.507088
{'key': 'ref34', 'year': '0', 'journal-title': 'The CdZnTe devices were fabricated at the University of Michigan from CdZnTe material acquired from eV Products located in Saxonburg'} / The CdZnTe devices were fabricated at the University of Michigan from CdZnTe material acquired from eV Products located in Saxonburg (0)
10.1063/1.88158
10.1063/1.112523
10.1109/23.467848
10.1016/S0168-9002(96)00352-X
10.1016/S0168-9002(96)00495-0
10.1016/S0168-9002(97)00782-1
10.1063/1.120895
10.1109/23.682424
{'key': 'ref18', 'author': 'frisch', 'year': '1944', 'journal-title': 'British Atomic Energy Report'} / British Atomic Energy Report by frisch (1944)
10.1139/cjr49a-019
10.1109/TNS.1967.4324459
10.1109/JRPROC.1939.228757
10.1016/S0168-9002(97)00620-7
10.1063/1.1710367
10.1016/0029-554X(75)90615-1
10.1557/PROC-302-3
10.1016/0029-554X(63)90106-X
10.1016/0168-9002(94)91603-9
10.1016/0168-9002(92)91227-Z
10.1016/0168-9002(87)90524-9
{'key': 'ref9', 'volume': '13', 'author': 'zanio', 'year': '1978', 'journal-title': 'Semiconductors for Room Temperature Nuclear Detector Applications in Semiconductors and Semimetals'} / Semiconductors for Room Temperature Nuclear Detector Applications in Semiconductors and Semimetals by zanio (1978)
10.1016/0029-554X(82)90626-7
{'key': 'ref20', 'author': 'knoll', 'year': '1989', 'journal-title': 'Radiation Detection and Measurement'} / Radiation Detection and Measurement by knoll (1989)
10.1063/1.1658281
10.1016/S0168-9002(98)00948-6
{'key': 'ref24', 'author': 'sze', 'year': '1981', 'journal-title': 'Physics of Semiconductor Devices'} / Physics of Semiconductor Devices by sze (1981)
10.1109/TNS.1972.4326752
10.1117/12.187260
10.1016/0969-8043(93)90086-P

Dates

Type	When
Created	22 years, 11 months ago (Aug. 24, 2002, 6:40 p.m.)
Deposited	3 years, 8 months ago (Nov. 29, 2021, 3:03 p.m.)
Indexed	4 months ago (April 21, 2025, 12:25 a.m.)
Issued	26 years, 2 months ago (June 1, 1999)
Published	26 years, 2 months ago (June 1, 1999)
Published Print	26 years, 2 months ago (June 1, 1999)

Funders 0

None

BibTeX

@article{McGregor_1999, title={Performance of CdZnTe geometrically weighted semiconductor Frisch grid radiation detectors}, volume={46}, ISSN={1558-1578}, url={http://dx.doi.org/10.1109/23.775523}, DOI={10.1109/23.775523}, number={3}, journal={IEEE Transactions on Nuclear Science}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={McGregor, D.S. and Rojeski, R.A.}, year={1999}, month=jun, pages={250–259} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        4,
        21
      ]
    ],
    "date-time": "2025-04-21T04:25:23Z",
    "timestamp": 1745209523778
  },
  "reference-count": 35,
  "publisher": "Institute of Electrical and Electronics Engineers (IEEE)",
  "issue": "3",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1999,
            6,
            1
          ]
        ],
        "date-time": "1999-06-01T00:00:00Z",
        "timestamp": 928195200000
      },
      "content-version": "vor",
      "delay-in-days": 0,
      "URL": "https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1999,
        6
      ]
    ]
  },
  "DOI": "10.1109/23.775523",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        8,
        24
      ]
    ],
    "date-time": "2002-08-24T22:40:25Z",
    "timestamp": 1030228825000
  },
  "page": "250-259",
  "source": "Crossref",
  "is-referenced-by-count": 25,
  "title": "Performance of CdZnTe geometrically weighted semiconductor Frisch grid radiation detectors",
  "prefix": "10.1109",
  "volume": "46",
  "author": [
    {
      "given": "D.S.",
      "family": "McGregor",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "R.A.",
      "family": "Rojeski",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "263",
  "reference": [
    {
      "key": "ref33",
      "doi-asserted-by": "publisher",
      "DOI": "10.1146/annurev.ns.38.120188.001245"
    },
    {
      "key": "ref32",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0029-554X(71)90235-7"
    },
    {
      "key": "ref31",
      "doi-asserted-by": "publisher",
      "DOI": "10.1103/PhysRevLett.75.156"
    },
    {
      "key": "ref30",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0029-554X(69)90561-8"
    },
    {
      "key": "ref35",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/23.507088"
    },
    {
      "key": "ref34",
      "year": "0",
      "journal-title": "The CdZnTe devices were fabricated at the University of Michigan from CdZnTe material acquired from eV Products located in Saxonburg"
    },
    {
      "key": "ref10",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.88158"
    },
    {
      "key": "ref11",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.112523"
    },
    {
      "key": "ref12",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/23.467848"
    },
    {
      "key": "ref13",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0168-9002(96)00352-X"
    },
    {
      "key": "ref14",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0168-9002(96)00495-0"
    },
    {
      "key": "ref15",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0168-9002(97)00782-1"
    },
    {
      "key": "ref16",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.120895"
    },
    {
      "key": "ref17",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/23.682424"
    },
    {
      "key": "ref18",
      "author": "frisch",
      "year": "1944",
      "journal-title": "British Atomic Energy Report"
    },
    {
      "key": "ref19",
      "doi-asserted-by": "publisher",
      "DOI": "10.1139/cjr49a-019"
    },
    {
      "key": "ref4",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/TNS.1967.4324459"
    },
    {
      "key": "ref28",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/JRPROC.1939.228757"
    },
    {
      "key": "ref3",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0168-9002(97)00620-7"
    },
    {
      "key": "ref27",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.1710367"
    },
    {
      "key": "ref6",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0029-554X(75)90615-1"
    },
    {
      "key": "ref5",
      "doi-asserted-by": "publisher",
      "DOI": "10.1557/PROC-302-3"
    },
    {
      "key": "ref29",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0029-554X(63)90106-X"
    },
    {
      "key": "ref8",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0168-9002(94)91603-9"
    },
    {
      "key": "ref7",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0168-9002(92)91227-Z"
    },
    {
      "key": "ref2",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0168-9002(87)90524-9"
    },
    {
      "key": "ref9",
      "volume": "13",
      "author": "zanio",
      "year": "1978",
      "journal-title": "Semiconductors for Room Temperature Nuclear Detector Applications in Semiconductors and Semimetals"
    },
    {
      "key": "ref1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0029-554X(82)90626-7"
    },
    {
      "key": "ref20",
      "author": "knoll",
      "year": "1989",
      "journal-title": "Radiation Detection and Measurement"
    },
    {
      "key": "ref22",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.1658281"
    },
    {
      "key": "ref21",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/S0168-9002(98)00948-6"
    },
    {
      "key": "ref24",
      "author": "sze",
      "year": "1981",
      "journal-title": "Physics of Semiconductor Devices"
    },
    {
      "key": "ref23",
      "doi-asserted-by": "publisher",
      "DOI": "10.1109/TNS.1972.4326752"
    },
    {
      "key": "ref26",
      "doi-asserted-by": "publisher",
      "DOI": "10.1117/12.187260"
    },
    {
      "key": "ref25",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/0969-8043(93)90086-P"
    }
  ],
  "container-title": "IEEE Transactions on Nuclear Science",
  "original-title": [],
  "link": [
    {
      "URL": "http://xplorestaging.ieee.org/ielx5/23/16851/00775523.pdf?arnumber=775523",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2021,
        11,
        29
      ]
    ],
    "date-time": "2021-11-29T20:03:17Z",
    "timestamp": 1638216197000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://ieeexplore.ieee.org/document/775523/"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1999,
        6
      ]
    ]
  },
  "references-count": 35,
  "journal-issue": {
    "issue": "3"
  },
  "URL": "http://dx.doi.org/10.1109/23.775523",
  "relation": {},
  "ISSN": [
    "0018-9499",
    "1558-1578"
  ],
  "subject": [],
  "container-title-short": "IEEE Trans. Nucl. Sci.",
  "published": {
    "date-parts": [
      [
        1999,
        6
      ]
    ]
  }
}