Crossref journal-article
Institute of Electrical and Electronics Engineers (IEEE)
IEEE Transactions on Magnetics (263)
Bibliography

Rijks, T. G. S. M., Sour, R. L. H., Neerinck, D. G., De Veirman, A. E. M., Coehoorn, R., Kools, J. C. S., Gillies, M. F., & de Jonge, W. J. M. (1995). Influence of grain size on the transport properties of Ni/sub 80/Fe/sub 20/ and Cu thin films. IEEE Transactions on Magnetics, 31(6), 3865–3867.

Authors 8
  1. T.G.S.M. Rijks (first)
  2. R.L.H. Sour (additional)
  3. D.G. Neerinck (additional)
  4. A.E.M. De Veirman (additional)
  5. R. Coehoorn (additional)
  6. J.C.S. Kools (additional)
  7. M.F. Gillies (additional)
  8. W.J.M. de Jonge (additional)
References 13 Referenced 26
  1. {'key': 'ref10', 'author': 'lenczowski', 'year': '0'} by lenczowski (0)
  2. 10.1007/978-1-4899-1519-1_24
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  6. 10.1017/S0305004100019952 / Proc Cambridge Philos Soc by fuchs (1938)
  7. 10.1103/PhysRevB.51.283
  8. 10.1103/PhysRevB.1.1382
  9. {'key': 'ref8', 'author': 'neerinck', 'year': '0'} by neerinck (0)
  10. {'key': 'ref7', 'author': 'kittel', 'year': '1986', 'journal-title': 'Introduction to Solid State Physics'} / Introduction to Solid State Physics by kittel (1986)
  11. {'key': 'ref2', 'volume': '2', 'author': 'tellier', 'year': '1982', 'journal-title': 'Science and Technology of Thin Films II'} / Science and Technology of Thin Films II by tellier (1982)
  12. 10.1063/1.1663668
  13. {'key': 'ref9', 'first-page': '1018', 'volume': 'mag 11', 'author': 'mcguire', 'year': '1975', 'journal-title': 'IEEE Trans'} / IEEE Trans by mcguire (1975)
Dates
Type When
Created 22 years, 11 months ago (Aug. 24, 2002, 6:26 p.m.)
Deposited 8 years, 2 months ago (June 15, 2017, 6:27 a.m.)
Indexed 1 year, 6 months ago (Feb. 10, 2024, 3:20 p.m.)
Issued 30 years, 7 months ago (Jan. 1, 1995)
Published 30 years, 7 months ago (Jan. 1, 1995)
Published Print 30 years, 7 months ago (Jan. 1, 1995)
Funders 0

None

@article{Rijks_1995, title={Influence of grain size on the transport properties of Ni/sub 80/Fe/sub 20/ and Cu thin films}, volume={31}, ISSN={0018-9464}, url={http://dx.doi.org/10.1109/20.489798}, DOI={10.1109/20.489798}, number={6}, journal={IEEE Transactions on Magnetics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Rijks, T.G.S.M. and Sour, R.L.H. and Neerinck, D.G. and De Veirman, A.E.M. and Coehoorn, R. and Kools, J.C.S. and Gillies, M.F. and de Jonge, W.J.M.}, year={1995}, pages={3865–3867} }