DOI: 10.1109/16.987117. Advanced model and analysis of series resistance for CMOS scaling into nanometer regime. I. Theoretical derivation

Advanced model and analysis of series resistance for CMOS scaling into nanometer regime. I. Theoretical derivation

10.1109/16.987117

Crossref journal-article

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Transactions on Electron Devices (263)

Bibliography

Seong-Dong Kim, Cheol-Min Park, & Woo, J. C. S. (2002). Advanced model and analysis of series resistance for CMOS scaling into nanometer regime. I. Theoretical derivation. IEEE Transactions on Electron Devices, 49(3), 457â466.

Authors 3

Seong-Dong Kim (first)
Cheol-Min Park (additional)
J.C.S. Woo (additional)

References 18 Referenced 58

10.1109/5.573737
10.1109/5.752515
{'journal-title': 'Semiconductor Ind. Assoc., 2001', 'key': 'ref3'} / Semiconductor Ind. Assoc., 2001
10.1109/vlsit.1998.689229
10.1006/spmi.1999.0809
10.1109/iedm.2000.904420
10.1109/T-ED.1986.22602
{'article-title': 'Device Electronics for Integrated Circuits', 'year': '1986', 'author': 'Muller', 'key': 'ref8'} / Device Electronics for Integrated Circuits by Muller (1986)
10.1017/9781108847087
10.1109/16.777166
10.1109/55.491829
10.1109/VTSA.1993.263633
10.1109/DRC.1999.806309
10.1109/16.123486
10.1016/0038-1101(96)00091-3
10.1109/T-ED.1987.22964
10.1109/16.144679
10.1109/16.249444

Dates

Type	When
Created	22 years, 11 months ago (Aug. 24, 2002, 4:14 p.m.)
Deposited	4 months, 3 weeks ago (March 30, 2025, 5:29 a.m.)
Indexed	4 months ago (April 20, 2025, 12:42 a.m.)
Issued	23 years, 5 months ago (March 1, 2002)
Published	23 years, 5 months ago (March 1, 2002)
Published Print	23 years, 5 months ago (March 1, 2002)

Funders 0

None

BibTeX

@article{Seong_Dong_Kim_2002, title={Advanced model and analysis of series resistance for CMOS scaling into nanometer regime. I. Theoretical derivation}, volume={49}, ISSN={0018-9383}, url={http://dx.doi.org/10.1109/16.987117}, DOI={10.1109/16.987117}, number={3}, journal={IEEE Transactions on Electron Devices}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Seong-Dong Kim and Cheol-Min Park and Woo, J.C.S.}, year={2002}, month=mar, pages={457–466} }

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