Crossref
journal-article
Institute of Electrical and Electronics Engineers (IEEE)
IEEE Transactions on Electron Devices (263)
References
13
Referenced
13
{'key': 'ref10', 'first-page': '18.5.1', 'article-title': 'Field-plated high gain lateral bipolar transistor in standard CMOS process for BiNMOS application', 'author': 'au', 'year': '1990', 'journal-title': 'Proc IEEE CICC'}
/ Proc IEEE CICC / Field-plated high gain lateral bipolar transistor in standard CMOS process for BiNMOS application by au (1990)10.1109/CICC.1992.591172
10.1109/4.98993
10.1109/4.98979
10.1109/IEDM.1991.235418
{'key': 'ref3', 'first-page': '614', 'volume': '90', 'author': 'nguyen', 'year': '1990', 'journal-title': 'Electrochem Soc Ext Abstracts'}
/ Electrochem Soc Ext Abstracts by nguyen (1990){'key': 'ref6', 'first-page': '443', 'article-title': 'The influence of fluorine on threshold voltage instabilities in P<superscript>+</superscript> polysilicon gated p-channel MOSFETs', 'author': 'baker', 'year': '1989', 'journal-title': 'JEDM Tech Dig'}
/ JEDM Tech Dig / The influence of fluorine on threshold voltage instabilities in P<superscript>+</superscript> polysilicon gated p-channel MOSFETs by baker (1989)10.1109/16.62295
{'key': 'ref8', 'first-page': '183', 'article-title': 'Oxide charge trapping and HCI susceptibility of a submicron CMOS dual-poly (N<superscript>+</superscript>/P<superscript>+</superscript>) gate technology', 'author': 'sun', 'year': '1989', 'journal-title': 'Proc IEEE IRPS'}
/ Proc IEEE IRPS / Oxide charge trapping and HCI susceptibility of a submicron CMOS dual-poly (N<superscript>+</superscript>/P<superscript>+</superscript>) gate technology by sun (1989){'key': 'ref7', 'first-page': '238', 'article-title': 'Doping of N<superscript>+</superscript> and P<superscript>+</superscript> polysilicon in a dual-gate CMOS process', 'author': 'wong', 'year': '1988', 'journal-title': 'IEDM Tech Dig'}
/ IEDM Tech Dig / Doping of N<superscript>+</superscript> and P<superscript>+</superscript> polysilicon in a dual-gate CMOS process by wong (1988){'key': 'ref2', 'first-page': '18.7.1', 'article-title': 'A dual-poly (N<superscript>+</superscript>/P<superscript>+</superscript>) gate, Ti-SALICIDE, double-metal technology for submicron CMOS ASIC and logic applications', 'author': 'sun', 'year': '1989', 'journal-title': 'Proc IEEE CICC'}
/ Proc IEEE CICC / A dual-poly (N<superscript>+</superscript>/P<superscript>+</superscript>) gate, Ti-SALICIDE, double-metal technology for submicron CMOS ASIC and logic applications by sun (1989){'key': 'ref1', 'article-title': 'Integration of power LDMOS into a low-voltage 0.5 ?m BiCMOS technology', 'author': 'tsui', 'year': '0', 'journal-title': '1992 IEEE International Electron Device Meeting'}
/ 1992 IEEE International Electron Device Meeting / Integration of power LDMOS into a low-voltage 0.5 ?m BiCMOS technology by tsui (0){'key': 'ref9', 'first-page': '284', 'author': 'sze', 'year': '1981', 'journal-title': 'Physics of Semiconductor Devices'}
/ Physics of Semiconductor Devices by sze (1981)
Dates
Type | When |
---|---|
Created | 22 years, 11 months ago (Aug. 24, 2002, 4:40 p.m.) |
Deposited | 3 years, 8 months ago (Nov. 29, 2021, 2:08 p.m.) |
Indexed | 1 year, 11 months ago (Sept. 13, 2023, 12:16 p.m.) |
Issued | 33 years, 7 months ago (Jan. 1, 1992) |
Published | 33 years, 7 months ago (Jan. 1, 1992) |
Published Print | 33 years, 7 months ago (Jan. 1, 1992) |
@article{Sun_1992, title={A fully complementary BiCMOS technology for sub-half-micrometer microprocessor applications}, volume={39}, ISSN={0018-9383}, url={http://dx.doi.org/10.1109/16.168754}, DOI={10.1109/16.168754}, number={12}, journal={IEEE Transactions on Electron Devices}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sun, S.W. and Tsui, P.G.Y. and Somero, B.M. and Klein, J. and Pintchovski, F. and Yeargain, J.R. and Pappert, B. and Bertram, R.}, year={1992}, pages={2733–2739} }