Crossref journal-article
International Union of Crystallography (IUCr)
Journal of Applied Crystallography (329)
Bibliography

Feder, R., & Berry, B. S. (1970). Seeman–Bohlin X-ray diffractometer for thin films. Journal of Applied Crystallography, 3(5), 372–379.

Authors 2
  1. R. Feder (first)
  2. B. S. Berry (additional)
References 0 Referenced 119

None

Dates
Type When
Created 23 years ago (July 27, 2002, 2:01 a.m.)
Deposited 7 months, 1 week ago (Jan. 10, 2025, 8:38 a.m.)
Indexed 7 months, 1 week ago (Jan. 11, 2025, 12:29 a.m.)
Issued 54 years, 10 months ago (Oct. 1, 1970)
Published 54 years, 10 months ago (Oct. 1, 1970)
Published Print 54 years, 10 months ago (Oct. 1, 1970)
Funders 0

None

@article{Feder_1970, title={Seeman–Bohlin X-ray diffractometer for thin films}, volume={3}, ISSN={0021-8898}, url={http://dx.doi.org/10.1107/s0021889870006441}, DOI={10.1107/s0021889870006441}, number={5}, journal={Journal of Applied Crystallography}, publisher={International Union of Crystallography (IUCr)}, author={Feder, R. and Berry, B. S.}, year={1970}, month=oct, pages={372–379} }