Crossref
journal-article
American Physical Society (APS)
Physical Review Letters (16)
References
32
Referenced
57
{'volume-title': 'ToF-SIMS: Surface Analysis by Mass Spectrometry', 'year': '2001', 'key': 'PhysRevLett.96.216104Cc1R1'}
/ ToF-SIMS: Surface Analysis by Mass Spectrometry (2001)10.1016/0040-6090(85)90384-0
10.1021/ac00185a009
10.1016/S0169-4332(02)00631-1
10.1016/S0169-4332(02)00629-3
10.1016/S0254-0584(98)00052-2
10.1021/jp049936a
10.1021/ac026338o
10.1016/j.apsusc.2004.03.098
10.1016/S0254-0584(98)00032-7
10.1016/S0167-5729(01)00015-2
10.1103/RevModPhys.71.1695
10.1063/1.1764594
10.1021/ac049641t
10.1016/j.apsusc.2004.03.113
10.1021/ac0492665
10.1021/ac048131w
10.1021/ac035532n
10.1021/ac048945c
10.1021/ja036549q
10.1021/ac0508189
10.1021/ja051223y
10.1016/j.jasms.2005.06.005
10.1063/1.1470232
10.1002/(SICI)1097-0231(19980930)12:18<1246::AID-RCM316>3.0.CO;2-C
10.1021/jp003913o
10.1063/1.1403438
10.1103/PhysRevB.33.7983
10.1088/0953-8984/14/4/312
10.1021/jp050821w
10.1016/0168-583X(88)90082-1
10.1002/sia.2069
Dates
Type | When |
---|---|
Created | 19 years, 2 months ago (June 1, 2006, 10:33 p.m.) |
Deposited | 7 months, 2 weeks ago (Jan. 2, 2025, 6:20 p.m.) |
Indexed | 1 month, 1 week ago (July 9, 2025, 6:48 p.m.) |
Issued | 19 years, 2 months ago (June 1, 2006) |
Published | 19 years, 2 months ago (June 1, 2006) |
Published Online | 19 years, 2 months ago (June 1, 2006) |
@article{Szakal_2006, title={Surface Sensitivity in Cluster-Ion-Induced Sputtering}, volume={96}, ISSN={1079-7114}, url={http://dx.doi.org/10.1103/physrevlett.96.216104}, DOI={10.1103/physrevlett.96.216104}, number={21}, journal={Physical Review Letters}, publisher={American Physical Society (APS)}, author={Szakal, Christopher and Kozole, Joseph and Russo, Michael F. and Garrison, Barbara J. and Winograd, Nicholas}, year={2006}, month=jun }