Bibliography
Otrokov, M. M., Rusinov, I. P., Blanco-Rey, M., Hoffmann, M., Vyazovskaya, A. Yu., Eremeev, S. V., Ernst, A., Echenique, P. M., Arnau, A., & Chulkov, E. V. (2019). Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet
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Dates
Type | When |
---|---|
Created | 6 years, 5 months ago (March 13, 2019, 3:09 p.m.) |
Deposited | 7 months, 2 weeks ago (Jan. 2, 2025, 5:06 p.m.) |
Indexed | 17 hours, 33 minutes ago (Aug. 21, 2025, 2:25 p.m.) |
Issued | 6 years, 5 months ago (March 13, 2019) |
Published | 6 years, 5 months ago (March 13, 2019) |
Published Online | 6 years, 5 months ago (March 13, 2019) |
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Euskal Herriko Unibertsitatea
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@article{Otrokov_2019, title={Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi>MnBi</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub><mml:msub><mml:mrow><mml:mi>Te</mml:mi></mml:mrow><mml:mrow><mml:mn>4</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math> Films}, volume={122}, ISSN={1079-7114}, url={http://dx.doi.org/10.1103/physrevlett.122.107202}, DOI={10.1103/physrevlett.122.107202}, number={10}, journal={Physical Review Letters}, publisher={American Physical Society (APS)}, author={Otrokov, M. M. and Rusinov, I. P. and Blanco-Rey, M. and Hoffmann, M. and Vyazovskaya, A. Yu. and Eremeev, S. V. and Ernst, A. and Echenique, P. M. and Arnau, A. and Chulkov, E. V.}, year={2019}, month=mar }