DOI: 10.1103/physrevlett.105.056802. Resonant Scattering by Realistic Impurities in Graphene

Resonant Scattering by Realistic Impurities in Graphene

10.1103/physrevlett.105.056802

Crossref journal-article

American Physical Society (APS)

Physical Review Letters (16)

Bibliography

Wehling, T. O., Yuan, S., Lichtenstein, A. I., Geim, A. K., & Katsnelson, M. I. (2010). Resonant Scattering by Realistic Impurities in Graphene. Physical Review Letters, 105(5).

Authors 5

T. O. Wehling (first)
S. Yuan (additional)
A. I. Lichtenstein (additional)
A. K. Geim (additional)
M. I. Katsnelson (additional)

References 34 Referenced 282

Dates

Type	When
Created	15 years ago (July 27, 2010, 10:07 a.m.)
Deposited	7 months, 2 weeks ago (Jan. 2, 2025, 6:06 p.m.)
Indexed	2 weeks, 1 day ago (Aug. 6, 2025, 9:03 a.m.)
Issued	15 years ago (July 27, 2010)
Published	15 years ago (July 27, 2010)
Published Online	15 years ago (July 27, 2010)

Funders 0

None

BibTeX

@article{Wehling_2010, title={Resonant Scattering by Realistic Impurities in Graphene}, volume={105}, ISSN={1079-7114}, url={http://dx.doi.org/10.1103/physrevlett.105.056802}, DOI={10.1103/physrevlett.105.056802}, number={5}, journal={Physical Review Letters}, publisher={American Physical Society (APS)}, author={Wehling, T. O. and Yuan, S. and Lichtenstein, A. I. and Geim, A. K. and Katsnelson, M. I.}, year={2010}, month=jul }

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