Crossref journal-article
American Physical Society (APS)
Physical Review E (16)
Bibliography

Daguier, P., Henaux, S., Bouchaud, E., & Creuzet, F. (1996). Quantitative analysis of a fracture surface by atomic force microscopy. Physical Review E, 53(6), 5637–5642.

Authors 4
  1. Pascal Daguier (first)
  2. Stéphane Henaux (additional)
  3. Elisabeth Bouchaud (additional)
  4. François Creuzet (additional)
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Dates
Type When
Created 23 years ago (July 26, 2002, 5:09 p.m.)
Deposited 8 years, 2 months ago (June 15, 2017, 12:08 a.m.)
Indexed 2 weeks, 2 days ago (Aug. 6, 2025, 8:51 a.m.)
Issued 29 years, 2 months ago (June 1, 1996)
Published 29 years, 2 months ago (June 1, 1996)
Published Online 29 years, 2 months ago (June 1, 1996)
Funders 0

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@article{Daguier_1996, title={Quantitative analysis of a fracture surface by atomic force microscopy}, volume={53}, ISSN={1095-3787}, url={http://dx.doi.org/10.1103/physreve.53.5637}, DOI={10.1103/physreve.53.5637}, number={6}, journal={Physical Review E}, publisher={American Physical Society (APS)}, author={Daguier, Pascal and Henaux, Stéphane and Bouchaud, Elisabeth and Creuzet, François}, year={1996}, month=jun, pages={5637–5642} }