DOI: 10.1103/physrevb.62.2034. Capacitance of a molecular overlayer on the silicon surface measured by scanning tunneling microscopy

Capacitance of a molecular overlayer on the silicon surface measured by scanning tunneling microscopy

10.1103/physrevb.62.2034

Crossref journal-article

American Physical Society (APS)

Physical Review B (16)

Bibliography

Akiyama, R., Matsumoto, T., & Kawai, T. (2000). Capacitance of a molecular overlayer on the silicon surface measured by scanning tunneling microscopy. Physical Review B, 62(3), 2034â2038.

Authors 3

Ryota Akiyama (first)
Takuya Matsumoto (additional)
Tomoji Kawai (additional)

References 17 Referenced 29

10.1038/17569 / Nature (London) by M. Bockrath (1999)
10.1016/S0039-6028(98)00031-4 / Surf. Sci. by J. S. Hovis (1998)
10.1116/1.589431 / J. Vac. Sci. Technol. B by J. S. Hovis (1997)
10.1007/s003390051200 / Appl. Phys. A: Mater. Sci. Process. by J. S. Hovis (1998)
{'key': 'PhysRevB.62.2034Cc5R1', 'volume-title': 'Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques, and Applications', 'year': '1993'} / Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques, and Applications (1993)
10.1103/PhysRevLett.76.1485 / Phys. Rev. Lett. by L. Olesen (1996)
10.1007/s003390051121 / Appl. Phys. A: Mater. Sci. Process. by L. Olesen (1998)
10.1016/0304-3991(92)90319-F / Ultramicroscopy by R. Schuster (1992)
10.1021/jp984519h / J. Phys. Chem. B by R. Akiyama (1999)
10.1016/S0039-6028(98)00783-3 / Surf. Sci. Lett. by R. Akiyama (1998)
10.1103/PhysRevB.39.5572 / Phys. Rev. B by M. Weimer (1989)
10.1116/1.585556 / J. Vac. Sci. Technol. B by C. J. Chen (1991)
10.1063/1.1702682 / J. Appl. Phys. by J. G. Simmons (1963)
10.1063/1.1729774 / J. Appl. Phys. by J. G. Simmons (1963)
10.1103/PhysRevLett.70.2471 / Phys. Rev. Lett. by M. McEllistrem (1993)
10.1038/338137a0 / Nature (London) by J. K. Spong (1989)
10.1116/1.576158 / J. Vac. Sci. Technol. A by R. J. Hamers (1989)

Dates

Type	When
Created	23 years ago (July 26, 2002, 10:05 p.m.)
Deposited	8 years, 2 months ago (June 15, 2017, 4:35 a.m.)
Indexed	1 year, 3 months ago (April 26, 2024, 9:45 a.m.)
Issued	25 years, 1 month ago (July 15, 2000)
Published	25 years, 1 month ago (July 15, 2000)
Published Online	25 years, 1 month ago (July 15, 2000)

Funders 0

None

BibTeX

@article{Akiyama_2000, title={Capacitance of a molecular overlayer on the silicon surface measured by scanning tunneling microscopy}, volume={62}, ISSN={1095-3795}, url={http://dx.doi.org/10.1103/physrevb.62.2034}, DOI={10.1103/physrevb.62.2034}, number={3}, journal={Physical Review B}, publisher={American Physical Society (APS)}, author={Akiyama, Ryota and Matsumoto, Takuya and Kawai, Tomoji}, year={2000}, month=jul, pages={2034–2038} }

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