DOI: 10.1103/physrevb.56.r4351. Quantized conductance of Si atomic wires

Quantized conductance of Si atomic wires

10.1103/physrevb.56.r4351

Crossref journal-article

American Physical Society (APS)

Physical Review B (16)

Bibliography

Mozos, J.-L., Wan, C. C., Taraschi, G., Wang, J., & Guo, H. (1997). Quantized conductance of Si atomic wires. Physical Review B, 56(8), R4351âR4354.

Authors 5

José-Luis Mozos (first)
C. C. Wan (additional)
Gianni Taraschi (additional)
Jian Wang (additional)
Hong Guo (additional)

References 32 Referenced 65

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Dates

Type	When
Created	23 years ago (July 26, 2002, 8:39 p.m.)
Deposited	8 years, 2 months ago (June 15, 2017, 3:54 a.m.)
Indexed	1 year, 10 months ago (Oct. 15, 2023, 9:32 a.m.)
Issued	28 years ago (Aug. 15, 1997)
Published	28 years ago (Aug. 15, 1997)
Published Online	28 years ago (Aug. 15, 1997)

Funders 0

None

BibTeX

@article{Mozos_1997, title={Quantized conductance of Si atomic wires}, volume={56}, ISSN={1095-3795}, url={http://dx.doi.org/10.1103/physrevb.56.r4351}, DOI={10.1103/physrevb.56.r4351}, number={8}, journal={Physical Review B}, publisher={American Physical Society (APS)}, author={Mozos, José-Luis and Wan, C. C. and Taraschi, Gianni and Wang, Jian and Guo, Hong}, year={1997}, month=aug, pages={R4351–R4354} }

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