DOI: 10.1103/physrevb.30.6211. Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy

Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy

10.1103/physrevb.30.6211

Crossref journal-article

American Physical Society (APS)

Physical Review B (16)

Bibliography

Poon, H. C., & Tong, S. Y. (1984). Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy. Physical Review B, 30(10), 6211â6213.

Authors 2

H. C. Poon (first)
S. Y. Tong (additional)

References 3 Referenced 178

10.1103/PhysRevB.30.1052 / Phys. Rev. B by W. F. Egelhoff, Jr. (1984)
10.1103/PhysRevB.17.3128 / Phys. Rev. B by C. H. Li (1978)
10.1103/PhysRevB.22.6085 / Phys. Rev. B by S. Kono (1980)

Dates

Type	When
Created	23 years ago (July 26, 2002, 11:25 p.m.)
Deposited	8 years, 2 months ago (June 15, 2017, 5:15 a.m.)
Indexed	1 year, 4 months ago (April 4, 2024, 1:55 p.m.)
Issued	40 years, 9 months ago (Nov. 15, 1984)
Published	40 years, 9 months ago (Nov. 15, 1984)
Published Online	40 years, 9 months ago (Nov. 15, 1984)

Funders 0

None

BibTeX

@article{Poon_1984, title={Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopy}, volume={30}, ISSN={0163-1829}, url={http://dx.doi.org/10.1103/physrevb.30.6211}, DOI={10.1103/physrevb.30.6211}, number={10}, journal={Physical Review B}, publisher={American Physical Society (APS)}, author={Poon, H. C. and Tong, S. Y.}, year={1984}, month=nov, pages={6211–6213} }

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