DOI: 10.1103/physrevb.25.4981. Structural morphology and electronic properties of the Si-Cr interface

Structural morphology and electronic properties of the Si-Cr interface

10.1103/physrevb.25.4981

Crossref journal-article

American Physical Society (APS)

Physical Review B (16)

Bibliography

Franciosi, A., Peterman, D. J., Weaver, J. H., & Moruzzi, V. L. (1982). Structural morphology and electronic properties of the Si-Cr interface. Physical Review B, 25(8), 4981â4993.

Authors 4

A. Franciosi (first)
D. J. Peterman (additional)
J. H. Weaver (additional)
V. L. Moruzzi (additional)

References 51 Referenced 83

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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 11:14 p.m.)
Deposited	8 years, 2 months ago (June 15, 2017, 5:09 a.m.)
Indexed	1 year ago (Aug. 12, 2024, 11:10 a.m.)
Issued	43 years, 4 months ago (April 15, 1982)
Published	43 years, 4 months ago (April 15, 1982)
Published Online	43 years, 4 months ago (April 15, 1982)

Funders 0

None

BibTeX

@article{Franciosi_1982, title={Structural morphology and electronic properties of the Si-Cr interface}, volume={25}, ISSN={0163-1829}, url={http://dx.doi.org/10.1103/physrevb.25.4981}, DOI={10.1103/physrevb.25.4981}, number={8}, journal={Physical Review B}, publisher={American Physical Society (APS)}, author={Franciosi, A. and Peterman, D. J. and Weaver, J. H. and Moruzzi, V. L.}, year={1982}, month=apr, pages={4981–4993} }

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