Crossref
journal-article
Oxford University Press (OUP)
Journal of Electron Microscopy (286)
References
17
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Dates
Type | When |
---|---|
Created | 14 years, 9 months ago (Nov. 12, 2010, 11:59 p.m.) |
Deposited | 7 years, 11 months ago (Aug. 24, 2017, 3:45 a.m.) |
Indexed | 2 weeks, 2 days ago (Aug. 6, 2025, 8:32 a.m.) |
Issued | 14 years, 9 months ago (Nov. 12, 2010) |
Published | 14 years, 9 months ago (Nov. 12, 2010) |
Published Online | 14 years, 9 months ago (Nov. 12, 2010) |
Published Print | 14 years, 6 months ago (Feb. 1, 2011) |
@article{Cao_2010, title={An automatic method of detecting and tracking fiducial markers for alignment in electron tomography}, volume={60}, ISSN={1477-9986}, url={http://dx.doi.org/10.1093/jmicro/dfq076}, DOI={10.1093/jmicro/dfq076}, number={1}, journal={Journal of Electron Microscopy}, publisher={Oxford University Press (OUP)}, author={Cao, M. and Takaoka, A. and Zhang, H.-B. and Nishi, R.}, year={2010}, month=nov, pages={39–46} }