DOI: 10.1093/jmicro/dfh067. Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

10.1093/jmicro/dfh067

Crossref journal-article

Oxford University Press (OUP)

Journal of Electron Microscopy (286)

Bibliography

Sasaki, H. (2004). Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling. Journal of Electron Microscopy, 53(5), 497â500.

Authors 1

H. Sasaki (first)

References 0 Referenced 34

None

Dates

Type	When
Created	20 years, 8 months ago (Dec. 3, 2004, 4:57 p.m.)
Deposited	8 years ago (Aug. 23, 2017, 11:26 a.m.)
Indexed	1 year, 4 months ago (April 7, 2024, 3:09 a.m.)
Issued	20 years, 10 months ago (Oct. 1, 2004)
Published	20 years, 10 months ago (Oct. 1, 2004)
Published Print	20 years, 10 months ago (Oct. 1, 2004)

Funders 0

None

BibTeX

@article{Sasaki_2004, title={Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling}, volume={53}, ISSN={1477-9986}, url={http://dx.doi.org/10.1093/jmicro/dfh067}, DOI={10.1093/jmicro/dfh067}, number={5}, journal={Journal of Electron Microscopy}, publisher={Oxford University Press (OUP)}, author={Sasaki, H.}, year={2004}, month=oct, pages={497–500} }

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