DOI: 10.1093/jmicro/dfh062. A study of the damage on FIB-prepared TEM samples of AlxGa1-xAs

A study of the damage on FIB-prepared TEM samples of AlxGa1-xAs

10.1093/jmicro/dfh062

Crossref journal-article

Oxford University Press (OUP)

Journal of Electron Microscopy (286)

Bibliography

Yabuuchi, Y. (2004). A study of the damage on FIB-prepared TEM samples of AlxGa1-xAs. Journal of Electron Microscopy, 53(5), 471â477.

Authors 1

Y. Yabuuchi (first)

References 0 Referenced 27

None

Dates

Type	When
Created	20 years, 8 months ago (Dec. 3, 2004, 4:57 p.m.)
Deposited	8 years ago (Aug. 23, 2017, 11:26 a.m.)
Indexed	10 months, 3 weeks ago (Oct. 5, 2024, 8:33 p.m.)
Issued	20 years, 11 months ago (Oct. 1, 2004)
Published	20 years, 11 months ago (Oct. 1, 2004)
Published Print	20 years, 11 months ago (Oct. 1, 2004)

Funders 0

None

BibTeX

@article{Yabuuchi_2004, title={A study of the damage on FIB-prepared TEM samples of AlxGa1-xAs}, volume={53}, ISSN={1477-9986}, url={http://dx.doi.org/10.1093/jmicro/dfh062}, DOI={10.1093/jmicro/dfh062}, number={5}, journal={Journal of Electron Microscopy}, publisher={Oxford University Press (OUP)}, author={Yabuuchi, Y.}, year={2004}, month=oct, pages={471–477} }

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