DOI: 10.1093/jmicro/dfh050. Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system

Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system

10.1093/jmicro/dfh050

Crossref journal-article

Oxford University Press (OUP)

Journal of Electron Microscopy (286)

Bibliography

Wang, Z. (2004). Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system. Journal of Electron Microscopy, 53(5), 489â491.

Authors 1

Z. Wang (first)

References 0 Referenced 1

None

Dates

Type	When
Created	20 years, 8 months ago (Dec. 3, 2004, 4:57 p.m.)
Deposited	8 years ago (Aug. 23, 2017, 11:25 a.m.)
Indexed	1 year, 10 months ago (Sept. 29, 2023, 2:44 a.m.)
Issued	20 years, 10 months ago (Oct. 1, 2004)
Published	20 years, 10 months ago (Oct. 1, 2004)
Published Print	20 years, 10 months ago (Oct. 1, 2004)

Funders 0

None

BibTeX

@article{Wang_2004, title={Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system}, volume={53}, ISSN={1477-9986}, url={http://dx.doi.org/10.1093/jmicro/dfh050}, DOI={10.1093/jmicro/dfh050}, number={5}, journal={Journal of Electron Microscopy}, publisher={Oxford University Press (OUP)}, author={Wang, Z.}, year={2004}, month=oct, pages={489–491} }

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