DOI: 10.1093/jmicro/53.3.257. HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis

HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis

10.1093/jmicro/53.3.257

Crossref journal-article

Oxford University Press (OUP)

Journal of Electron Microscopy (286)

Bibliography

Peng, Y. (2004). HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. Journal of Electron Microscopy, 53(3), 257â266.

Authors 1

Y. Peng (first)

References 0 Referenced 71

None

Dates

Type	When
Created	21 years, 1 month ago (July 16, 2004, 5:42 p.m.)
Deposited	8 years ago (Aug. 23, 2017, 8:12 a.m.)
Indexed	1 month ago (July 26, 2025, 4:56 a.m.)
Issued	21 years, 3 months ago (June 1, 2004)
Published	21 years, 3 months ago (June 1, 2004)
Published Print	21 years, 3 months ago (June 1, 2004)

Funders 0

None

BibTeX

@article{Peng_2004, title={HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis}, volume={53}, ISSN={1477-9986}, url={http://dx.doi.org/10.1093/jmicro/53.3.257}, DOI={10.1093/jmicro/53.3.257}, number={3}, journal={Journal of Electron Microscopy}, publisher={Oxford University Press (OUP)}, author={Peng, Y.}, year={2004}, month=jun, pages={257–266} }

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