DOI: 10.1093/jmicro/53.2.129. Direct observation of a stacking fault in Si1-xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM

Direct observation of a stacking fault in Si1-xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM

10.1093/jmicro/53.2.129

Crossref journal-article

Oxford University Press (OUP)

Journal of Electron Microscopy (286)

Bibliography

Yamasaki, J. (2004). Direct observation of a stacking fault in Si1-xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM. Journal of Electron Microscopy, 53(2), 129â135.

Authors 1

J. Yamasaki (first)

References 0 Referenced 9

None

Dates

Type	When
Created	21 years, 3 months ago (May 12, 2004, 8:25 p.m.)
Deposited	8 years ago (Aug. 23, 2017, 9:24 a.m.)
Indexed	1 year, 10 months ago (Oct. 17, 2023, 9:50 a.m.)
Issued	21 years, 4 months ago (April 1, 2004)
Published	21 years, 4 months ago (April 1, 2004)
Published Print	21 years, 4 months ago (April 1, 2004)

Funders 0

None

BibTeX

@article{Yamasaki_2004, title={Direct observation of a stacking fault in Si1-xGex semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM}, volume={53}, ISSN={1477-9986}, url={http://dx.doi.org/10.1093/jmicro/53.2.129}, DOI={10.1093/jmicro/53.2.129}, number={2}, journal={Journal of Electron Microscopy}, publisher={Oxford University Press (OUP)}, author={Yamasaki, J.}, year={2004}, month=apr, pages={129–135} }

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