DOI: 10.1093/jmicro/51.6.383. Retrieval process of high-resolution HAADF-STEM images

Retrieval process of high-resolution HAADF-STEM images

10.1093/jmicro/51.6.383

Crossref journal-article

Oxford University Press (OUP)

Journal of Electron Microscopy (286)

Bibliography

Nakanishi, N. (2002). Retrieval process of high-resolution HAADF-STEM images. Journal of Electron Microscopy, 51(6), 383â390.

Authors 1

N. Nakanishi (first)

References 0 Referenced 20

None

Dates

Type	When
Created	22 years, 5 months ago (Feb. 26, 2003, 4:25 p.m.)
Deposited	7 years, 11 months ago (Aug. 23, 2017, 8:31 a.m.)
Indexed	3 weeks, 6 days ago (July 25, 2025, 7 a.m.)
Issued	22 years, 9 months ago (Nov. 1, 2002)
Published	22 years, 9 months ago (Nov. 1, 2002)
Published Print	22 years, 9 months ago (Nov. 1, 2002)

Funders 0

None

BibTeX

@article{Nakanishi_2002, title={Retrieval process of high-resolution HAADF-STEM images}, volume={51}, ISSN={1477-9986}, url={http://dx.doi.org/10.1093/jmicro/51.6.383}, DOI={10.1093/jmicro/51.6.383}, number={6}, journal={Journal of Electron Microscopy}, publisher={Oxford University Press (OUP)}, author={Nakanishi, N.}, year={2002}, month=nov, pages={383–390} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        7,
        25
      ]
    ],
    "date-time": "2025-07-25T11:00:25Z",
    "timestamp": 1753441225649
  },
  "reference-count": 0,
  "publisher": "Oxford University Press (OUP)",
  "issue": "6",
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2002,
        11,
        1
      ]
    ]
  },
  "DOI": "10.1093/jmicro/51.6.383",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2003,
        2,
        26
      ]
    ],
    "date-time": "2003-02-26T21:25:08Z",
    "timestamp": 1046294708000
  },
  "page": "383-390",
  "source": "Crossref",
  "is-referenced-by-count": 20,
  "title": "Retrieval process of high-resolution HAADF-STEM images",
  "prefix": "10.1093",
  "volume": "51",
  "author": [
    {
      "given": "N.",
      "family": "Nakanishi",
      "sequence": "first",
      "affiliation": []
    }
  ],
  "member": "286",
  "container-title": "Journal of Electron Microscopy",
  "original-title": [],
  "link": [
    {
      "URL": "http://academic.oup.com/jmicro/article-pdf/51/6/383/2662822/510383.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2017,
        8,
        23
      ]
    ],
    "date-time": "2017-08-23T12:31:31Z",
    "timestamp": 1503491491000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://academic.oup.com/jmicro/article-lookup/doi/10.1093/jmicro/51.6.383"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2002,
        11,
        1
      ]
    ]
  },
  "references-count": 0,
  "journal-issue": {
    "issue": "6"
  },
  "URL": "http://dx.doi.org/10.1093/jmicro/51.6.383",
  "relation": {},
  "ISSN": [
    "0022-0744",
    "1477-9986"
  ],
  "subject": [],
  "published": {
    "date-parts": [
      [
        2002,
        11,
        1
      ]
    ]
  }
}