Crossref journal-article
IOP Publishing
Measurement Science and Technology (266)
Bibliography

Firoz, S. H., Yagi, T., Taketoshi, N., Ishikawa, K., & Baba, T. (2010). Direct observation of thermal energy transfer across the thin metal film on silicon substrates by a rear heating–front detection thermoreflectance technique. Measurement Science and Technology, 22(2), 024012.

Authors 5
  1. S H Firoz (first)
  2. T Yagi (additional)
  3. N Taketoshi (additional)
  4. K Ishikawa (additional)
  5. T Baba (additional)
References 31 Referenced 12
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Dates
Type When
Created 14 years, 8 months ago (Dec. 21, 2010, 11:23 p.m.)
Deposited 5 years, 2 months ago (June 14, 2020, 6:27 p.m.)
Indexed 1 year ago (Aug. 7, 2024, 1:14 p.m.)
Issued 14 years, 8 months ago (Dec. 21, 2010)
Published 14 years, 8 months ago (Dec. 21, 2010)
Published Online 14 years, 8 months ago (Dec. 21, 2010)
Published Print 14 years, 6 months ago (Feb. 1, 2011)
Funders 0

None

@article{Firoz_2010, title={Direct observation of thermal energy transfer across the thin metal film on silicon substrates by a rear heating–front detection thermoreflectance technique}, volume={22}, ISSN={1361-6501}, url={http://dx.doi.org/10.1088/0957-0233/22/2/024012}, DOI={10.1088/0957-0233/22/2/024012}, number={2}, journal={Measurement Science and Technology}, publisher={IOP Publishing}, author={Firoz, S H and Yagi, T and Taketoshi, N and Ishikawa, K and Baba, T}, year={2010}, month=dec, pages={024012} }