DOI: 10.1088/0957-0233/18/8/047. Power transistor near-infrared microthermography using an intensified CCD camera and frame integration

Power transistor near-infrared microthermography using an intensified CCD camera and frame integration

10.1088/0957-0233/18/8/047

Crossref journal-article

IOP Publishing

Measurement Science and Technology (266)

Bibliography

Dhokkar, S., Serio, B., Lagonotte, P., & Meyrueis, P. (2007). Power transistor near-infrared microthermography using an intensified CCD camera and frame integration. Measurement Science and Technology, 18(8), 2696â2703.

Authors 4

S Dhokkar (first)
B Serio (additional)
P Lagonotte (additional)
P Meyrueis (additional)

References 17 Referenced 26

{'key': '1', 'first-page': 'Sept. 104-07', 'volume': '2', 'author': 'Buttay C Salah T B Bergogne D Allard B Morel H Chante J-P', 'year': '2004', 'journal-title': 'Power Electron. Lett., IEEE'} / Power Electron. Lett., IEEE by Buttay C Salah T B Bergogne D Allard B Morel H Chante J-P (2004)
10.1109/IEMDC.2001.939371
10.1109/PET.1996.565910
{'key': '4', 'first-page': '57', 'author': 'Ferrier S', 'year': '1997', 'journal-title': 'Proc. 23rd Int. Symp. for Testing and Failure Analysis (ASM Int.)'} / Proc. 23rd Int. Symp. for Testing and Failure Analysis (ASM Int.) by Ferrier S (1997)
10.1109/STHERM.1991.152907
10.1049/el:20020685
10.1117/12.612261
10.1063/1.1310345
10.1063/1.1758308
{'key': '10', 'first-page': '711', 'author': 'Serio B Cretin B', 'year': '2003', 'journal-title': 'Congrès SFT'} / Congrès SFT by Serio B Cretin B (2003)
{'key': '11', 'author': 'Maldaque X', 'year': '2001', 'journal-title': 'Theory and Practice of Infrared Technology for Non-Destructive Testing'} / Theory and Practice of Infrared Technology for Non-Destructive Testing by Maldaque X (2001)
10.1088/0957-0233/16/5/024 / Meas. Sci. Technol. by Quek S (2005)
10.1007/978-3-662-08396-3 / Lock-In Thermography: Basics and Use for Functional Diagnostics of Electronic Components by Breitenstein O (2003)
10.1063/1.351366
{'key': '15', 'author': 'Busse G Bauer M Rippel L W Wu D', 'year': '1992', 'journal-title': 'Dans Quantitave Infrared Thermography'} / Dans Quantitave Infrared Thermography by Busse G Bauer M Rippel L W Wu D (1992)
10.1063/1.355159
{'key': '17', 'author': 'Palik E D', 'journal-title': 'Handbook of Optical Constants of Solids II'} / Handbook of Optical Constants of Solids II by Palik E D

Dates

Type	When
Created	18 years, 1 month ago (July 17, 2007, 11:14 p.m.)
Deposited	5 years, 4 months ago (April 11, 2020, 12:46 a.m.)
Indexed	1 year, 1 month ago (July 4, 2024, 11:57 a.m.)
Issued	18 years, 1 month ago (July 17, 2007)
Published	18 years, 1 month ago (July 17, 2007)
Published Online	18 years, 1 month ago (July 17, 2007)
Published Print	18 years ago (Aug. 1, 2007)

Funders 0

None

BibTeX

@article{Dhokkar_2007, title={Power transistor near-infrared microthermography using an intensified CCD camera and frame integration}, volume={18}, ISSN={1361-6501}, url={http://dx.doi.org/10.1088/0957-0233/18/8/047}, DOI={10.1088/0957-0233/18/8/047}, number={8}, journal={Measurement Science and Technology}, publisher={IOP Publishing}, author={Dhokkar, S and Serio, B and Lagonotte, P and Meyrueis, P}, year={2007}, month=jul, pages={2696–2703} }

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