DOI: 10.1088/0950-7671/42/4/322. Method for producing large Si films for preselected imperfection analysis

Method for producing large Si films for preselected imperfection analysis

10.1088/0950-7671/42/4/322

Crossref journal-article

IOP Publishing

Journal of Scientific Instruments (266)

Bibliography

Lawrence, J. E., & Koehler, H. (1965). Method for producing large Si films for preselected imperfection analysis. Journal of Scientific Instruments, 42(4), 270â272.

Authors 2

J E Lawrence (first)
H Koehler (additional)

References 3 Referenced 22

10.1088/0508-3443/13/9/303 / Brit. J. Appl. Phys. by Booker G R (1962)
10.1063/1.1728767 / J. Appl. Phys. by Queisser H J (1962)
10.1063/1.1717551

Dates

Type	When
Created	22 years, 8 months ago (Dec. 21, 2002, 12:49 a.m.)
Deposited	5 years, 4 months ago (April 11, 2020, 4:39 a.m.)
Indexed	1 year, 6 months ago (Feb. 11, 2024, 3:52 a.m.)
Issued	60 years, 4 months ago (April 1, 1965)
Published	60 years, 4 months ago (April 1, 1965)
Published Online	22 years, 8 months ago (Dec. 20, 2002)
Published Print	60 years, 4 months ago (April 1, 1965)

Funders 0

None

BibTeX

@article{Lawrence_1965, title={Method for producing large Si films for preselected imperfection analysis}, volume={42}, ISSN={0950-7671}, url={http://dx.doi.org/10.1088/0950-7671/42/4/322}, DOI={10.1088/0950-7671/42/4/322}, number={4}, journal={Journal of Scientific Instruments}, publisher={IOP Publishing}, author={Lawrence, J E and Koehler, H}, year={1965}, month=apr, pages={270–272} }

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