DOI: 10.1088/0508-3443/13/9/303. Method of preparing Si and Ge specimens for examination by transmission electron microscopy

Method of preparing Si and Ge specimens for examination by transmission electron microscopy

10.1088/0508-3443/13/9/303

Crossref journal-article

IOP Publishing

British Journal of Applied Physics (266)

Bibliography

Booker, G. R., & Stickler, R. (1962). Method of preparing Si and Ge specimens for examination by transmission electron microscopy. British Journal of Applied Physics, 13(9), 446â448.

Authors 2

G R Booker (first)
R Stickler (additional)

References 4 Referenced 97

{'key': '1', 'first-page': '411', 'volume': '10', 'author': 'Geach G A', 'year': '1957', 'journal-title': 'Research'} / Research by Geach G A (1957)
10.1088/0508-3443/12/3/302 / Brit. J. Appl. Phys. by Irving B A (1961)
10.1088/0508-3443/11/11/305 / Brit. J. Appl. Phys. by Phillips R (1960)
10.1063/1.1717551

Dates

Type	When
Created	22 years, 9 months ago (Nov. 20, 2002, 11:17 p.m.)
Deposited	5 years, 5 months ago (March 4, 2020, 11:29 a.m.)
Indexed	2 months ago (June 25, 2025, 7:27 p.m.)
Issued	62 years, 11 months ago (Sept. 1, 1962)
Published	62 years, 11 months ago (Sept. 1, 1962)
Published Online	22 years, 9 months ago (Nov. 20, 2002)
Published Print	62 years, 11 months ago (Sept. 1, 1962)

Funders 0

None

BibTeX

@article{Booker_1962, title={Method of preparing Si and Ge specimens for examination by transmission electron microscopy}, volume={13}, ISSN={0508-3443}, url={http://dx.doi.org/10.1088/0508-3443/13/9/303}, DOI={10.1088/0508-3443/13/9/303}, number={9}, journal={British Journal of Applied Physics}, publisher={IOP Publishing}, author={Booker, G R and Stickler, R}, year={1962}, month=sep, pages={446–448} }

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