Crossref
journal-article
IOP Publishing
Semiconductor Science and Technology (266)
References
11
Referenced
15
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{'key': '11', 'first-page': '51', 'author': 'Born M', 'year': '1970'}
by Born M (1970)
Dates
Type | When |
---|---|
Created | 22 years, 11 months ago (Aug. 25, 2002, 6:02 a.m.) |
Deposited | 5 years, 4 months ago (April 11, 2020, 11:48 a.m.) |
Indexed | 1 year, 6 months ago (Feb. 4, 2024, 12:23 p.m.) |
Issued | 33 years, 3 months ago (May 1, 1992) |
Published | 33 years, 3 months ago (May 1, 1992) |
Published Online | 26 years, 7 months ago (Jan. 1, 1999) |
Published Print | 33 years, 3 months ago (May 1, 1992) |
@article{Powell_1992, title={X-ray diffraction and reflectivity characterization of SiGe superlattice structures}, volume={7}, ISSN={1361-6641}, url={http://dx.doi.org/10.1088/0268-1242/7/5/001}, DOI={10.1088/0268-1242/7/5/001}, number={5}, journal={Semiconductor Science and Technology}, publisher={IOP Publishing}, author={Powell, A R and Bowen, D K and Wormington, M and Kubiak, R A and Parker, E H C and Hudson, J and Augustus, P D}, year={1992}, month=may, pages={627–631} }