Crossref journal-article
IOP Publishing
Semiconductor Science and Technology (266)
Authors 7
  1. A R Powell (first)
  2. D K Bowen (additional)
  3. M Wormington (additional)
  4. R A Kubiak (additional)
  5. E H C Parker (additional)
  6. J Hudson (additional)
  7. P D Augustus (additional)
References 11 Referenced 15
  1. 10.1557/PROC-208-161 / Proc. Mater. Res. Soc. by Powell A (1991)
  2. 10.1088/0022-3727/20/1/010 / J. Phys. D: Appl. Phys. by Cowley R A (1986)
  3. 10.1107/S0365110X62003473
  4. 10.3406/bulmi.1964.5769 / Bull. Soc. Fr. Minéral Cristallogr. by Taupin D (1964)
  5. 10.1557/PROC-208-113 / Proc. Mater. Res. Soc. by Bowen D K (1991)
  6. {'key': '6', 'author': 'Wormington M', 'year': '1991'} by Wormington M (1991)
  7. 10.1103/PhysRev.95.359
  8. 10.1051/rphysap:01980001503076100 / Revue Phys. Appl. by Nevot L (1980)
  9. 10.1063/1.331401 / J. Appl. Phys. by Philipp H R (1982)
  10. 10.1103/PhysRevA.38.2457
  11. {'key': '11', 'first-page': '51', 'author': 'Born M', 'year': '1970'} by Born M (1970)
Dates
Type When
Created 22 years, 11 months ago (Aug. 25, 2002, 6:02 a.m.)
Deposited 5 years, 4 months ago (April 11, 2020, 11:48 a.m.)
Indexed 1 year, 6 months ago (Feb. 4, 2024, 12:23 p.m.)
Issued 33 years, 3 months ago (May 1, 1992)
Published 33 years, 3 months ago (May 1, 1992)
Published Online 26 years, 7 months ago (Jan. 1, 1999)
Published Print 33 years, 3 months ago (May 1, 1992)
Funders 0

None

@article{Powell_1992, title={X-ray diffraction and reflectivity characterization of SiGe superlattice structures}, volume={7}, ISSN={1361-6641}, url={http://dx.doi.org/10.1088/0268-1242/7/5/001}, DOI={10.1088/0268-1242/7/5/001}, number={5}, journal={Semiconductor Science and Technology}, publisher={IOP Publishing}, author={Powell, A R and Bowen, D K and Wormington, M and Kubiak, R A and Parker, E H C and Hudson, J and Augustus, P D}, year={1992}, month=may, pages={627–631} }