DOI: 10.1088/0022-3735/17/10/023. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films

Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films

10.1088/0022-3735/17/10/023

Crossref journal-article

IOP Publishing

Journal of Physics E: Scientific Instruments (266)

Bibliography

Swanepoel, R. (1984). Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films. Journal of Physics E: Scientific Instruments, 17(10), 896â903.

Authors 1

R Swanepoel (first)

References 8 Referenced 643

10.1016/0040-6090(83)90471-6
{'key': '2', 'first-page': '135', 'author': 'Clark A H', 'year': '1980'} by Clark A H (1980)
10.1103/PhysRevB.20.716
{'key': '4', 'first-page': '193', 'author': 'Heavens O S', 'year': '1964'} by Heavens O S (1964)
10.1016/0040-6090(83)90469-8
10.1088/0022-3735/16/12/023 / J. Phys. E: Sci. Instrum. by Swanepoel R (1983)
{'key': '7', 'author': 'Swanepoel R', 'year': '1984', 'journal-title': 'Thin Solid Films', 'ISSN': 'http://id.crossref.org/issn/0040-6090', 'issn-type': 'print'} / Thin Solid Films by Swanepoel R (1984)
10.1016/0040-6090(77)90055-4

Dates

Type	When
Created	23 years ago (July 26, 2002, 4:45 p.m.)
Deposited	5 years, 4 months ago (April 10, 2020, 10:37 p.m.)
Indexed	6 days, 17 hours ago (Aug. 19, 2025, 6:38 a.m.)
Issued	40 years, 10 months ago (Oct. 1, 1984)
Published	40 years, 10 months ago (Oct. 1, 1984)
Published Online	24 years, 8 months ago (Nov. 29, 2000)
Published Print	40 years, 10 months ago (Oct. 1, 1984)

Funders 0

None

BibTeX

@article{Swanepoel_1984, title={Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films}, volume={17}, ISSN={0022-3735}, url={http://dx.doi.org/10.1088/0022-3735/17/10/023}, DOI={10.1088/0022-3735/17/10/023}, number={10}, journal={Journal of Physics E: Scientific Instruments}, publisher={IOP Publishing}, author={Swanepoel, R}, year={1984}, month=oct, pages={896–903} }

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