DOI: 10.1088/0022-3727/46/30/305502. Damage mechanisms in electron microscopy of insulating materials

Damage mechanisms in electron microscopy of insulating materials

10.1088/0022-3727/46/30/305502

Crossref journal-article

IOP Publishing

Journal of Physics D: Applied Physics (266)

Bibliography

Jiang, N. (2013). Damage mechanisms in electron microscopy of insulating materials. Journal of Physics D: Applied Physics, 46(30), 305502.

Authors 1

Nan Jiang (first)

References 48 Referenced 41

{'key': '1', 'first-page': '171', 'volume': '4', 'author': 'Hobbs L W', 'year': '1990', 'journal-title': 'Scanning Electron Microsc. Suppl.'} / Scanning Electron Microsc. Suppl. by Hobbs L W (1990)
{'key': '2', 'first-page': '185', 'volume': '4', 'author': 'Humphreys C J', 'year': '1990', 'journal-title': 'Scanning Microsc. Suppl.', 'ISSN': 'http://id.crossref.org/issn/0892-953X', 'issn-type': 'print'} / Scanning Microsc. Suppl. by Humphreys C J (1990)
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{'key': '13', 'first-page': '223', 'volume': '792', 'author': 'Jiang N', 'year': '2003', 'journal-title': 'Mater. Res. Soc. Symp. Proc.', 'ISSN': 'http://id.crossref.org/issn/0272-9172', 'issn-type': 'print'} / Mater. Res. Soc. Symp. Proc. by Jiang N (2003)
10.1016/j.jnucmat.2010.06.013
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10.1063/1.2430779
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10.1016/0304-3991(95)00077-1
10.1017/S1431927604040747 / Microsc. Microanal. by Howie A (2004)
10.1002/sia.740010103
{'key': '23', 'author': 'Griffiths D J', 'year': '1999', 'journal-title': 'Introduction to Electrodynamics'} / Introduction to Electrodynamics by Griffiths D J (1999)
{'key': '24', 'first-page': '602', 'author': 'Serway R A', 'year': '1998', 'journal-title': 'Principles of Physics'} / Principles of Physics by Serway R A (1998)
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10.1111/j.1151-2916.1983.tb10632.x
10.1080/00337578608208726
10.1002/pssr.201206476
10.2138/am-1997-9-1003 / Am. Mineralogist by Meldrum A (1997)
10.1016/S0168-583X(03)01710-5
10.1016/j.jnoncrysol.2006.10.080
10.1103/PhysRevB.68.064207
10.1063/1.126406
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10.1016/0167-9317(89)90119-6
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10.1016/0304-3991(87)90240-3

Dates

Type	When
Created	12 years, 1 month ago (July 5, 2013, 6:13 a.m.)
Deposited	5 years, 4 months ago (April 11, 2020, 4:52 a.m.)
Indexed	1 day, 10 hours ago (Aug. 21, 2025, 2:09 p.m.)
Issued	12 years, 1 month ago (July 5, 2013)
Published	12 years, 1 month ago (July 5, 2013)
Published Online	12 years, 1 month ago (July 5, 2013)
Published Print	12 years ago (July 31, 2013)

Funders 0

None

BibTeX

@article{Jiang_2013, title={Damage mechanisms in electron microscopy of insulating materials}, volume={46}, ISSN={1361-6463}, url={http://dx.doi.org/10.1088/0022-3727/46/30/305502}, DOI={10.1088/0022-3727/46/30/305502}, number={30}, journal={Journal of Physics D: Applied Physics}, publisher={IOP Publishing}, author={Jiang, Nan}, year={2013}, month=jul, pages={305502} }

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