Crossref journal-article
IOP Publishing
Journal of Physics D: Applied Physics (266)
Bibliography

Xue, K., Ho, H. P., & Xu, J. B. (2007). Local study of thickness-dependent electronic properties of ultrathin silicon oxide near SiO2/Si interface. Journal of Physics D: Applied Physics, 40(9), 2886–2893.

Authors 3
  1. K Xue (first)
  2. H P Ho (additional)
  3. J B Xu (additional)
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Dates
Type When
Created 18 years, 4 months ago (April 19, 2007, 11:43 p.m.)
Deposited 5 years, 4 months ago (April 11, 2020, 3:52 a.m.)
Indexed 1 year, 10 months ago (Oct. 18, 2023, 2:56 a.m.)
Issued 18 years, 4 months ago (April 19, 2007)
Published 18 years, 4 months ago (April 19, 2007)
Published Online 18 years, 4 months ago (April 19, 2007)
Published Print 18 years, 3 months ago (May 7, 2007)
Funders 0

None

@article{Xue_2007, title={Local study of thickness-dependent electronic properties of ultrathin silicon oxide near SiO2/Si interface}, volume={40}, ISSN={1361-6463}, url={http://dx.doi.org/10.1088/0022-3727/40/9/033}, DOI={10.1088/0022-3727/40/9/033}, number={9}, journal={Journal of Physics D: Applied Physics}, publisher={IOP Publishing}, author={Xue, K and Ho, H P and Xu, J B}, year={2007}, month=apr, pages={2886–2893} }