Crossref
journal-article
IOP Publishing
Journal of Physics D: Applied Physics (266)
References
38
Referenced
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Dates
Type | When |
---|---|
Created | 18 years, 4 months ago (April 19, 2007, 11:43 p.m.) |
Deposited | 5 years, 4 months ago (April 11, 2020, 3:52 a.m.) |
Indexed | 1 year, 10 months ago (Oct. 18, 2023, 2:56 a.m.) |
Issued | 18 years, 4 months ago (April 19, 2007) |
Published | 18 years, 4 months ago (April 19, 2007) |
Published Online | 18 years, 4 months ago (April 19, 2007) |
Published Print | 18 years, 3 months ago (May 7, 2007) |
@article{Xue_2007, title={Local study of thickness-dependent electronic properties of ultrathin silicon oxide near SiO2/Si interface}, volume={40}, ISSN={1361-6463}, url={http://dx.doi.org/10.1088/0022-3727/40/9/033}, DOI={10.1088/0022-3727/40/9/033}, number={9}, journal={Journal of Physics D: Applied Physics}, publisher={IOP Publishing}, author={Xue, K and Ho, H P and Xu, J B}, year={2007}, month=apr, pages={2886–2893} }