DOI: 10.1080/713718197. Piezoresponse Scanning Force Microscopy: What Quantitative Information Can We Really Get Out of Piezoresponse Measurements on Ferroelectric Thin Films

Piezoresponse Scanning Force Microscopy: What Quantitative Information Can We Really Get Out of Piezoresponse Measurements on Ferroelectric Thin Films

10.1080/713718197

Crossref journal-article

Informa UK Limited

Integrated Ferroelectrics (301)

Bibliography

Harnagea, C., Pignolet, A., Alexe, M., & Hesse, D. (2002). Piezoresponse Scanning Force Microscopy: What Quantitative Information Can We Really Get Out of Piezoresponse Measurements on Ferroelectric Thin Films. Integrated Ferroelectrics, 44(1), 113â124.

Authors 4

Catalin Harnagea (first)
Alain Pignolet (additional)
Marin Alexe (additional)
Dietrich Hesse (additional)

References 0 Referenced 61

None

Dates

Type	When
Created	18 years, 1 month ago (June 25, 2007, 3:53 p.m.)
Deposited	7 years, 9 months ago (Oct. 31, 2017, 3:34 a.m.)
Indexed	2 months, 2 weeks ago (June 6, 2025, 5:47 a.m.)
Issued	23 years, 7 months ago (Jan. 1, 2002)
Published	23 years, 7 months ago (Jan. 1, 2002)
Published Online	14 years, 10 months ago (Oct. 18, 2010)
Published Print	23 years, 7 months ago (Jan. 1, 2002)

Funders 0

None

BibTeX

@article{Harnagea_2002, title={Piezoresponse Scanning Force Microscopy: What Quantitative Information Can We Really Get Out of Piezoresponse Measurements on Ferroelectric Thin Films}, volume={44}, ISSN={1607-8489}, url={http://dx.doi.org/10.1080/713718197}, DOI={10.1080/713718197}, number={1}, journal={Integrated Ferroelectrics}, publisher={Informa UK Limited}, author={Harnagea, Catalin and Pignolet, Alain and Alexe, Marin and Hesse, Dietrich}, year={2002}, month=jan, pages={113–124} }

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