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Critical Reviews in Solid State and Materials Sciences (301)
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Tong, S. Y., & Li, C. H. (1981). Diffraction effects in angle-resolved photoemission spectroscopy. Critical Reviews in Solid State and Materials Sciences, 10(2), 209–231.

Authors 2
  1. S. Y. Tong (first)
  2. C. H. Li (additional)
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Dates
Type When
Created 18 years, 1 month ago (June 25, 2007, 5:09 a.m.)
Deposited 6 years, 3 months ago (April 29, 2019, 6:46 a.m.)
Indexed 3 years, 4 months ago (April 2, 2022, 3:27 a.m.)
Issued 44 years, 3 months ago (May 1, 1981)
Published 44 years, 3 months ago (May 1, 1981)
Published Online 18 years, 10 months ago (Sept. 27, 2006)
Published Print 44 years, 3 months ago (May 1, 1981)
Funders 0

None

@article{Tong_1981, title={Diffraction effects in angle-resolved photoemission spectroscopy}, volume={10}, ISSN={1547-6561}, url={http://dx.doi.org/10.1080/10408438108243634}, DOI={10.1080/10408438108243634}, number={2}, journal={Critical Reviews in Solid State and Materials Sciences}, publisher={Informa UK Limited}, author={Tong, S. Y. and Li, C. H.}, year={1981}, month=may, pages={209–231} }