DOI: 10.1080/0141861021000020095. On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy

On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy

10.1080/0141861021000020095

Crossref journal-article

Informa UK Limited

Philosophical Magazine (301)

Bibliography

Kret, S., DÅuÅ¼ewski, P., DÅuÅ¼ewski, P., & Laval, J.-Y. (2003). On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy. Philosophical Magazine, 83(2), 231â244.

Authors 4

Sławomir Kret (first)
Paweł Dłużewski (additional)
Piotr Dłużewski (additional)
Jean-Yves Laval (additional)

References 19 Referenced 21

10.1016/0304-3991(94)90149-X
10.1016/0304-3991(93)90234-O
10.1016/0022-0248(95)00117-4
10.1016/0167-6636(95)00020-8
GAIROLA , B. K. D. 1979. “Dislocations in Solids”. Edited by: Nabarro , F. R. N. Vol. I, 223Amsterdam: North-Holland.
HIRTH , J. P. and LOTHE , J. 1982. Theory of Dislocations, 752New York: Wiley.
10.1016/S0304-3991(98)00035-7
{'key': 'CIT0008', 'first-page': '249', 'volume': '77', 'author': 'KRET S.', 'year': '1998', 'journal-title': 'Phil. Mag. A'} / Phil. Mag. A by KRET S. (1998)
10.1007/978-3-642-94719-3
Balian , R. KJeman , M. and Poiries , J.P. , eds. 1981. “Physics of Defects”. 215–315. Amsterdam: North-Holland.
10.1126/science.269.5223.519
{'key': 'CIT0012', 'volume-title': 'Optimas 6.5 User Guide and Technical Reference,', 'author': 'MEDIA CYBERNETICS', 'year': '1999', 'edition': '9'} / Optimas 6.5 User Guide and Technical Reference, by MEDIA CYBERNETICS (1999)
10.1016/S0304-3991(96)00073-3
10.1046/j.1365-2818.1999.00477.x
10.1016/0304-3991(94)00200-7
10.1016/S0040-6090(97)01113-9
10.1016/0169-4332(89)90105-0
TEODOSIU , C. 1970. “Fundamental Aspects of Dislocation Theory, National Bureau of Standards Special Publication”. Edited by: Simmonds , A. Vol. 317, 837–876. Washington, DC: National Bureau of Standards. (2)
10.1007/978-3-662-11634-0

Dates

Type	When
Created	21 years, 3 months ago (May 1, 2004, 3 p.m.)
Deposited	7 years, 1 month ago (June 28, 2018, 10:32 a.m.)
Indexed	1 year, 7 months ago (Jan. 9, 2024, 5:45 p.m.)
Issued	22 years, 7 months ago (Jan. 1, 2003)
Published	22 years, 7 months ago (Jan. 1, 2003)
Published Online	14 years, 9 months ago (Nov. 14, 2010)
Published Print	22 years, 7 months ago (Jan. 1, 2003)

Funders 0

None

BibTeX

@article{Kret_2003, title={On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy}, volume={83}, ISSN={1478-6443}, url={http://dx.doi.org/10.1080/0141861021000020095}, DOI={10.1080/0141861021000020095}, number={2}, journal={Philosophical Magazine}, publisher={Informa UK Limited}, author={Kret, Sławomir and Dłużewski, Paweł and Dłużewski, Piotr and Laval, Jean-Yves}, year={2003}, month=jan, pages={231–244} }

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