DOI: 10.1063/1.99515. Direct force measurement in scanning tunneling microscopy

Direct force measurement in scanning tunneling microscopy

10.1063/1.99515

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

A novel force measurement using a scanning tunneling microscope as a forced oscillator is described. Results obtained from tunneling between a tungsten tip and a graphite substrate show that a maximum tip-sample force about 10−6 N exists during the constant current mode of operation. These results are in agreement with a previous model where large contact areas insulated by contaminants between tip and substrate were suggested as a cause of large tip-sample interaction forces. This method can achieve a force sensitivity of 10−8 N and for conductive substrates provide a simple, versatile alternative to existing methods of atomic force microscopy.

Bibliography

Tang, S. L., Bokor, J., & Storz, R. H. (1988). Direct force measurement in scanning tunneling microscopy. Applied Physics Letters, 52(3), 188â190.

Authors 3

S. L. Tang (first)
J. Bokor (additional)
R. H. Storz (additional)

References 14 Referenced 33

10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. (1986)
10.1209/0295-5075/3/12/006 / Europhys. Lett. (1987)
{'key': '2024020222023417300_r3'}
10.1063/1.97800 / Appl. Phys. Lett. (1987)
10.1103/PhysRevLett.57.2403 / Phys. Rev. Lett. (1986)
10.1063/1.338807 / J. Appl. Phys. (1987)
{'key': '2024020222023417300_r7'}
10.1103/PhysRevLett.50.120 / Phys. Rev. Lett. (1983)
10.1103/PhysRevLett.57.444 / Phys. Rev. Lett. (1986)
10.1103/PhysRevB.34.9015 / Phys. Rev. B (1986)
10.1143/JJAP.26.L306 / Jpn. J. Appl. Phys. (1987)
{'key': '2024020222023417300_r12'}
10.1103/PhysRevLett.57.3235 / Phys. Rev. Lett. (1986)
10.1116/1.573301 / J. Vac. Sci. Technol. A (1985)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:48 a.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 5:18 p.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 10:01 a.m.)
Issued	37 years, 7 months ago (Jan. 18, 1988)
Published	37 years, 7 months ago (Jan. 18, 1988)
Published Print	37 years, 7 months ago (Jan. 18, 1988)

Funders 0

None

BibTeX

@article{Tang_1988, title={Direct force measurement in scanning tunneling microscopy}, volume={52}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.99515}, DOI={10.1063/1.99515}, number={3}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Tang, S. L. and Bokor, J. and Storz, R. H.}, year={1988}, month=jan, pages={188–190} }

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