Crossref
journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract
The diffusion of deuterated polystyrene (d-PS) in a polystyrene matrix was used to probe the damage to the polymer surface caused by reactive ion beam etching (RIBE). Diffusion was seen to be hindered in a d-PS film treated by RIBE, an immobilization apparently due to crosslinking of the surface monolayer of the polymer sample.
References
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:03 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 2, 2024, 5:15 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 4, 2024, 11:02 a.m.) |
Issued | 37 years, 7 months ago (Jan. 11, 1988) |
Published | 37 years, 7 months ago (Jan. 11, 1988) |
Published Print | 37 years, 7 months ago (Jan. 11, 1988) |
@article{Tead_1988, title={Diffusion of reactive ion beam etched polymers}, volume={52}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.99062}, DOI={10.1063/1.99062}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Tead, Stanley F. and Vanderlinde, William E. and Ruoff, Arthur L. and Kramer, Edward J.}, year={1988}, month=jan, pages={101–102} }